Fabric defect detection method based on single-classification support vector machine (SVM)
A support vector machine, single-classification technology, applied in the field of pattern recognition, can solve problems such as unsatisfactory defect detection ability, achieve the effect of improving generalization ability, ensuring detection accuracy requirements, and avoiding local extreme values
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[0023] Specific embodiments of the present invention are described in detail below, but it should be understood that the protection scope of the present invention is not limited by the specific embodiments.
[0024] Unless expressly stated otherwise, throughout the specification and claims, the term "comprise" or variations thereof such as "includes" or "includes" and the like will be understood to include the stated elements or constituents, and not Other elements or other components are not excluded.
[0025] Such as figure 1 As shown, the fabric defect detection method based on single classification support vector machine, the steps are:
[0026] (1.1) Construct a Gabor filter function in the two-dimensional space domain, and obtain the Gabor filter function in the frequency domain through two-dimensional Fourier transform. The parameters of the Gabor filter to be optimized are (σ x , σ y , λ, θ).
[0027] The two-dimensional space domain Gabor filter function can be ex...
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