Chip single event effect detection method and device

Abstract

A chip single-event effect detection method and device, the method comprising: placing a to-be-detected chip in a testing machine, and triggering the to-be-detected chip to generate a single-event effect; randomly turning off a scanning register for the to-be-detected chip, and forming a random observation matrix; providing an input testing vector for the to-be-detected chip so as to obtain an output testing vector of the to-be-detected chip, and obtaining an error total vector according to the output testing vector; and carrying out compressed sensing signal reconstruction on the error total vector, and determining an internal sensitive region of the to-be-detected chip. The method may be used to efficiently and conveniently detect the single-event effect of a chip.

Description

technical field [0001] The invention relates to the technical field of integrated circuits, in particular to a chip single event effect detection method and device. Background technique [0002] The importance of integrated circuit reliability research has been highlighted with the rapid progress of the semiconductor industry. The new high-performance chip with small package, high speed and low power consumption has greatly enhanced sensitivity to particle radiation, and can produce many semiconductor ionizing radiation effects, also known as single event effects. figure 1 It is a schematic diagram of semiconductor single event effect caused by incident high-energy particles in the prior art, such as figure 1 As shown, single event effects can cause electronic equipment to deviate from normal function and performance, resulting in reduced reliability of chips and even failure. [0003] In addition to space rays that can cause chip single event effects, a large number of ra...

AI Technical Summary

Problems solved by technology

However, even using pulsed lasers to test the reliability of single event effects is inefficient and cumbersome.

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