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Probe antenna for terahertz waveband near-field imaging

A near-field imaging, terahertz technology, applied in the direction of the antenna grounding switch structure connection, the structure of the radiating element, etc., can solve the problems of low efficiency of the probe antenna and difficult mechanical manufacturing, and achieve the enhancement of the input electric field and the simple mechanical manufacturing. Effect

Inactive Publication Date: 2016-08-10
JILIN UNIV
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Benefits of technology

This technology improves how well an electrical probes used for testing radioactive materials have become more efficient at detecting radiation emitted from these substances. It simplifies its manufacturing process by making them easier to use with different standards' guidelines or shapes that match those specifications. Additionally, this technology allows for easy changes made on the couplings between the test device itself and other components such as signal processing circuits without having to modify any parts they were designed around.

Problems solved by technology

This patents describes various technical problem addressed in the patented text relating to improving the performance of materials' nondestructiveness tests such as X ray absorption cross section measurements. Current techniques involve bulky equipment requiring highly trained operators who may also cause damage during operation. There is therefore a desire for better ways to detect materials without having physical contact.

Method used

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  • Probe antenna for terahertz waveband near-field imaging
  • Probe antenna for terahertz waveband near-field imaging
  • Probe antenna for terahertz waveband near-field imaging

Examples

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Embodiment 1

[0028] Embodiment 1: This example uses the three-dimensional electromagnetic field simulation software CST MICROWAVE STUDIO (Microwave Studio) of Germany CST (Computer Simulation Technology) company to carry out simulation analysis on this embodiment. First build a probe antenna model in the terahertz band in CST.

[0029] In this example, the antenna is prepared in the following way: first step, the terahertz coupling input part and the terahertz resonant cavity cavity of the required size are made by micro-nano processing technology; The narrow sides of the waveguide and the terahertz resonant cavity are coated with metal on the surface. From the inside to the outside, there are titanium bonding layer, aluminum working layer and gold protection layer respectively, and then the required terahertz wave near-field probe antenna is made.

[0030] like figure 1 and 2 As shown, this example includes a terahertz coupling input part 1 , a terahertz resonant cavity 2 , a PMMA surfa...

Embodiment 2

[0041] Embodiment 2: In this embodiment, the beam size of the transmitting end of the antenna is related to the ratio of the cross-section of the needle tip port. When other external conditions remain unchanged, such as Figure 8 As shown, only change the length-to-width ratio of the tip end cross-section to 0.02x1mm 2 , the Y-O-Z interface whose electric field strength propagates inside the antenna is as Figure 9 As shown, the beam width at the tip tip is proportional to the port width.

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Abstract

The invention discloses a probe antenna for terahertz waveband near-field imaging and specifically relates to surface metallized coating on a narrow edge of an antenna on the basis of polymethyl methacrylate (PMMA) material manufacture. The antenna comprises a terahertz signal couple input part, a terahertz resonant cavity and a PMMA surface metallized thin film coating layer. The antenna inputs a terahertz signal via a waveguide radiator, changes the transmission mode of the terahertz signal and further effectively changes terahertz electric-field radiation, thereby achieving the aim of terahertz near-field scanning imaging. The technical field of terahertz electronic devices is related. The probe antenna of the invention has the characteristics of having a simple structure, being easy to machine and manufacture and making it easy to perform couple operation with terahertz standard waveguide. The output power and the efficiency of the probe antenna of the invention are significantly superior to those of existing terahertz near-field scanning antennas. The probe antenna has wide market prospects in terms of material defect detection and material composition identification.

Description

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Claims

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Application Information

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Owner JILIN UNIV
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