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Multi-defect positioning method based on search algorithm

A technology of search algorithm and positioning method, applied in computing, instrumentation, electrical and digital data processing, etc., can solve problems such as difficulty in use and time-consuming, and achieve the effect of efficient and feasible algorithm

Inactive Publication Date: 2016-07-13
TIANJIN UNIV
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Problems solved by technology

This method works well, but takes a lot of time and is difficult to use in practice

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  • Multi-defect positioning method based on search algorithm
  • Multi-defect positioning method based on search algorithm
  • Multi-defect positioning method based on search algorithm

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Embodiment Construction

[0064] The core of the GAMFal algorithm is the calculation formula of the Multi-Ochiai suspiciousness coefficient and the selection of the genetic operator. figure 1 The flow chart of the whole algorithm is given. The algorithm is divided into two stages. In the first stage, the greedy algorithm is used to initialize the population of multi-defect distribution; and then the selection, crossover and mutation operators are executed to generate new individuals and add them to In the population, at the same time, the Multi-Ochiai suspiciousness coefficient is used as the fitness value to evaluate the individual and evolve to obtain a new population; if the termination condition is met, the final optimal multi-defect distribution population will be obtained. Then enter the second stage, according to the multi-defect distribution in the optimal population, the suspiciousness ranking of the corresponding program entities is obtained, and the algorithm ends.

[0065] 1. Chromosome cod...

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Abstract

The invention discloses a multi-defect positioning method based on a search algorithm. The method includes the steps that 1, the search algorithm at a first stage is executed, wherein the following processing that firstly, a population with multi-defect distribution is initialized through a greedy algorithm, then a selection operator, a crossover operator and a mutation operator are executed to generate a new individual, the new individual is re-inserted into the original population, a next-generation population is formed, and when a terminal condition of the search algorithm is met, a second stage is executed is specially included; 2, multi-defect positioning at a second stage is executed, wherein a final defect distribution combined population is obtained, an executable entity rank is obtained according to candidate defect distribution populations, the executable entity sequence is mapped to a real position of a program, a rank of equivocation coefficients of corresponding program entities is obtained according to multi-defect distribution in the optimal candidate defect distribution population, and the algorithm is completed. The effect of an adopted GAMFal algorithm on the multi (single) defect positioning problem is superior to that of an existing SFL method; only little artificial participation is needed; the efficiency of the algorithm is feasible.

Description

technical field [0001] The invention relates to software development technology, in particular to a method for locating software defects. Background technique [0002] Software fault localization technology is an analysis method to determine the specific location of the defect when some test cases fail to execute after executing the test case set. In the traditional software development process, developers usually manually debug, find defects and fix them. However, this traditional defect location method is costly [1] . In order to improve debugging efficiency and liberate developers from boring manual debugging, researchers have proposed a large number of automatic defect location methods to assist developers to locate defects quickly and accurately. Existing automatic defect localization methods can be simply divided into two categories: static localization methods and dynamic localization methods. The static positioning method [2] Locate defects by analyzing the code...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G06F11/36
CPCG06F11/3684G06F11/3692
Inventor 王赞樊向宇
Owner TIANJIN UNIV
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