A Compressed Sampling Analog-to-Digital Converter Using Sampling and Quantization Circuit

A technology of analog-to-digital converter and compressed sampling, applied in the direction of analog-to-digital conversion, code conversion, instruments, etc., can solve problems such as quantizer mismatch, loop filter mismatch, overall structure complexity, etc., to reduce various Effects of Error, Mismatch Reduction, and Complexity Reduction

Active Publication Date: 2019-06-18
TSINGHUA UNIV
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  • Abstract
  • Description
  • Claims
  • Application Information

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Problems solved by technology

Moreover, each channel of this structure requires a quantizer, so the overall structure is more complicated, and there are problems of quantizer mismatch and loop filter mismatch.

Method used

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  • A Compressed Sampling Analog-to-Digital Converter Using Sampling and Quantization Circuit
  • A Compressed Sampling Analog-to-Digital Converter Using Sampling and Quantization Circuit
  • A Compressed Sampling Analog-to-Digital Converter Using Sampling and Quantization Circuit

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Embodiment Construction

[0027] The compression sampling analog-to-digital converter using the sampling quantization circuit proposed by the present invention, such as Figure 4 shown, including N random sampling branches and a quantizer, each random sampling branch consists of N random sampling switches, N analog integrators, N output control switches, quantizers, random sampling control signal generators and outputs Clock composition, the input ends of the N analog integrators are respectively connected with the analog signal input through N random sampling switches, and the output ends of the N analog integrators are respectively connected with the input of the quantizer through N output control switches. The N random sampling switches are respectively connected with the random sampling control signal generator, and the N output control switches are respectively connected with the output clock.

[0028] In the compressed sampling analog-to-digital converter of the present invention, the sampling sw...

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Abstract

The invention provides a sampling and quantification circuit used for a compression sampling analog-to-digital converter and belongs to the field of mixed signal integration circuit design technology. According to the invention, a signal processing procedure including signal observation, error estimation, signal calibration and signal restoration for error correction and a sampling and quantification circuit realization structure with multi-way parallel sampling, simulation domain integration and signal quantization device quantification are provided. The sampling and quantification circuit realization structure successively inputs all simulation sampling and integration results into the same quantification device, so a mismatching problem in a multi-way quantification process is effectively reduced; complexity in realization of a compression sampling analog-to-digital converter system is reduced; and the sampling and quantification circuit is designed with modules, so independence and universality of designing of all modules are improved.

Description

technical field [0001] The invention relates to a compressed sampling analog-to-digital converter using a sampling and quantization circuit, and belongs to the technical field of mixed-signal integrated circuit design. Background technique [0002] The basic idea of ​​analog-to-digital converter (Analog-to-Digital Converter, hereinafter referred to as ADC) is to quantize a continuous analog signal within a certain range through the steps of sampling, holding, quantization, and encoding in a specific way, and quantize the quantized signal. The result is represented by a specific set of digital codes and used as the input signal to the digital processing system. The traditional analog-to-digital converter is limited by the Nyquist sampling theorem, and the signal must be sampled at a frequency twice higher than the processing signal bandwidth, so the application of high-frequency signal processing puts forward a better performance of the ADC. High requirements, subject to fac...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): H03M1/54H03M1/38
CPCH03M1/38H03M1/54
Inventor 李冬梅韩晨曦魏经纬
Owner TSINGHUA UNIV
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