Eye graph generating method based on vector network analyzer

Abstract

The invention discloses an eye graph generating method based on a vector network analyzer. The generating method comprises following steps of (1) carrying out test on a to-be-tested piece via a vector network analyzer and obtaining a scattering parameter of a frequency domain, i.e., the S parameter; 2) fitting the S parameter so as to obtain a transfer function by use of a vector matching method in the vector network analyzer; 3) using a time domain type as input of the transfer function and obtaining transient time domain response of the to-be-tested piece; and 4) carrying out superposition processing on the transient time domain response and obtaining a corresponding eye graph. According to the invention, requirements on sampling speed of an analog-digital converter imposed by an eye graph test are effective reduced; fitting precision of the scattering parameter, i.e., the S parameter is improved; and eye graph test speed of the vector network analyzer is increased.

Description

technical field [0001] The invention relates to a method for generating an eye pattern based on a vector network analyzer. Background technique [0002] Traditionally, a vector network analyzer is an instrument for frequency domain testing in the field of microwave and millimeter wave design and production, and its network characteristics are analyzed by obtaining the scattering parameters (S parameters) of the tested parts. With the development of vector network analyzers in the direction of multi-function, not only new functions are added in the field of frequency domain testing, but also gradually enter the field of time domain testing. [0003] In recent years, with the rapid development of mobile communication and Internet industry, the data communication rate has reached Gbps. Microwave effects, which were rarely paid attention to in product design before, are gradually appearing in high-speed circuits, and the signal integrity problems it brings are also receiving mo...

AI Technical Summary

Problems solved by technology

[0007] Since the oscilloscope is a broadband test equipment, its test noise is much higher than that of the vector network analyzer, which will affect the accuracy of the test when generating the eye diagram

At the same time, the jitter noise of the trigger circuit and the noise of the clock recovery circuit will also be introduced into the measurement of the eye diagram

In order to reduce noise, components with higher precision can be used, and complex processing algorithms can be used, but this will undoubtedly increase the cost of the product and increase the time consumption of the test

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