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Minimum-duty-ratio semiconductor laser peak value optical power testing device and method

A test device and duty cycle technology, which is applied in the direction of using an electrical radiation detector for photometry, etc., can solve the problem of inability to realize the peak power detection of a laser pulse signal with a small duty cycle and a narrow pulse width, and achieve a fast rise time, guaranteeing Accuracy and the effect of instrumentation

Inactive Publication Date: 2016-01-20
CHINA ELECTRONIS TECH INSTR CO LTD
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AI Technical Summary

Problems solved by technology

However, the device developed by the peak hold method cannot realize the peak power detection of the laser pulse signal with a rapid rise time and a small duty cycle and narrow pulse width.

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  • Minimum-duty-ratio semiconductor laser peak value optical power testing device and method

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Embodiment Construction

[0038] The present invention is described in detail below in conjunction with accompanying drawing:

[0039] Such as figure 1 As shown, the present invention proposes a test device and method for semiconductor laser peak optical power, wherein the device is mainly composed of high-speed photoelectric conversion and preamplification module (1), high-speed pulse light holding and sampling module (2), high-speed pulse frequency and It is composed of a widening test module (3), an FPGA control and display module (4) and other modules.

[0040]The high-speed laser pulse passes through the high-speed photoelectric conversion and preamplification module (1), which realizes the photoelectric conversion of the high-speed pulse optical signal and the preamplification of the signal. The preamplified electrical pulse signal is held and sampled by high-speed pulse light respectively. A module (2) and a high-speed pulse frequency and stretching test module (3). Among them, the high-speed ...

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Abstract

The invention discloses a minimum-duty-ratio semiconductor laser peak value optical power testing device and method, and the method comprises the steps that a high-speed photovoltaic conversion and pre-amplification module carries out the photovoltaic conversion of an optical signal of a high-speed laser pulse and the pre-amplification of a signal, thereby generating a high-speed electric pulse signal; the electric pulse signal is transmitted to a high-speed pulse optical maintaining and sampling module and a high-speed pulse frequency and widening testing module; the high-speed pulse optical maintaining and sampling module carries out the maintaining and sampling of the high-speed electric pulse signal, generates an integral maintaining signal, solves a pulse mean power, and transmits the pulse mean power to an FPGA controller; and the high-speed pulse frequency and widening testing module achieves the accurate measurement of frequency and pulse width of the high-speed electric pulse signal, and enables the measurement data to be transmitted to the FPGA controller. The method can achieve the detection of the peak value of a narrow pulse width pulse signal with shorter rise time and minimum duty ratio, and can achieve the instrumentation.

Description

technical field [0001] The invention relates to a testing device and method for peak optical power of a semiconductor laser with extremely small duty ratio and narrow pulse width. Background technique [0002] Laser peak power is usually defined as the ratio of laser pulse energy to laser pulse half width. When the repetition frequency is low or the pulse width is wide, the half-width τ of the laser pulse waveform can be measured first with a waveform detector and an oscilloscope, and then the energy E of the laser pulse can be measured with a laser energy meter. then press P p =E / τ Calculate the laser peak power. When the repetition frequency is high or the pulse width is narrow, since the laser pulse energy cannot be directly measured, the laser pulse frequency f and the laser pulse waveform half-width τ can be measured with a waveform detector and an oscilloscope first, and then the laser power meter can be used to measure the laser pulse energy. Average power P avg ....

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01J1/42
Inventor 刘磊牛继勇闫继送孙强韩强韩顺利吴寅初
Owner CHINA ELECTRONIS TECH INSTR CO LTD
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