Lamination imaging technology based on pre-lighting imaging

Abstract

The invention discloses lamination imaging technology for carrying out lamination reconstruction constraint through pre-lighting imaging. The lamination imaging technology is characterized by, obtaining a formed image of a periphery image of a sample to be tested through pre-lighting as a known condition for lamination recovery; then, obtaining diffraction images of the sample to be tested and the periphery image through lamination scanning, and simultaneously substituting the diffraction images and pre-lighting images into a lamination iterative algorithm based on the pre-lighting imaging designed in the invention for processing; and finally, carrying out reconstruction to obtain a complex amplitude image of the sample to be tested. Constraint is carried out on lamination recovery through the pre-lighting imaging mode, so that recovery quality of the sample to be tested on the aspect of complex amplitude, especially on the aspect of phase, can be improved greatly, and experiment operation is simple; and compared with the conventional lamination imaging technology, the lamination imaging technology in the invention can obtain a better recovery result without extra cost. Meanwhile, the technology has obvious improvement on resistance to noise and aperture position offset.

Description

technical field [0001] The invention relates to a stack imaging technology based on pre-illumination imaging, and belongs to the technical field of stack imaging. It specifically relates to an image obtained by pre-illuminating the image of the sample to be tested and its surroundings, extracting the image around the sample as a known condition for stack recovery, and then using stack scanning to obtain the diffraction image of the sample to be tested with the surrounding image, and The two are jointly brought into the stacked iterative algorithm based on pre-illumination imaging, and the method of finally recovering the complex amplitude image of the sample is obtained. Background technique [0002] Stacked diffraction imaging is an imaging technology that does not require lenses. By overlapping and collecting redundant diffraction pattern information, it can well restore the complex amplitude information of the sample. It is important in the fields of X-rays, visible light...

AI Technical Summary

Problems solved by technology

[0005] 1. In actual operation, there is a certain deviation between the position of the illumination beam and the theoretical position, which affects the quality of the restored image

[0006] 2. The experiment is greatly disturbed by random noise and system noise, and there is still a lot of room for improvement in the effect of image restoration

[0007] 3. The conditions of the experimental facilities are relatively limited

Images