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Transient high resolution spectrometer based on F-P etalon

A high-resolution, etalon technology, applied in the field of high-resolution spectral measurement, can solve the problems of low spectral resolution, limited application range, and high signal-to-noise ratio, to improve detection sensitivity, improve data transmission speed, enhance strength and The effect of the signal-to-noise ratio

Active Publication Date: 2015-11-25
BEIJING NORMAL UNIVERSITY
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Problems solved by technology

This kind of spectrometer detects the evanescent wave of the optical waveguide, and then obtains the spectrum through Fourier transform. In principle, it can realize transient measurement, but its biggest problem is that the sensitivity is relatively low and the signal-to-noise ratio is very high; at the same time, its spectral resolution It can only reach the order of hundreds of MHz, which limits its application range
In addition, the fiber optic spectrometer developed rapidly in recent years can realize the measurement of dynamic spectrum and transient spectrum, but limited by CCD or other photosensitive array components, its spectral resolution is low, and it cannot meet the needs of high-resolution spectral measurement. occasion

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Embodiment Construction

[0014] The embodiments of the present invention are described in further detail below in conjunction with the accompanying drawings, but the present embodiments do not limit other inventions, and all similar structures and similar changes of the present invention should be included in the scope of protection of the present invention.

[0015] as attached figure 1 As shown, what is provided by the example of the present invention is a spectrometer device that utilizes one or more F-P etalon serial connection multi-pass technology to realize simultaneous measurement of high-resolution spectrum and transient spectrum. It includes a beam converter system composed of lens 1 (1), diaphragm (2), lens 2 (3), cylindrical lens, polarizing prism, 1 / 2 wave plate and three mirrors connected in series in a ring. Ring cavity system, a spectroscopic system composed of a fixed cavity length etalon and a variable optical cavity length etalon, focusing lens and CCD. Among them, the refractive i...

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Abstract

The invention discloses a transient high resolution spectrometer based on an F-P etalon, relating to the high resolution light spectrum measurement field and the transient light spectrometry field. The high resolution spectrometer disclosed by the invention realizes the high resolution detection of single-pulse transient spectrum through utilizing standard self-angle-light splitting and serial connection of multiple F-P etalons. The invention can be applied in the high resolution spectrum measurement field including the Brillouin scattering, the Zeeman effect, the spin electronics, etc.

Description

technical field [0001] The invention relates to a transient high-resolution spectrometer designed based on an etalon-connected multi-pass technology, which is mainly used in the field of high-resolution spectrum measurement such as Brillouin scattering. Background technique [0002] Spectral analysis has always been one of the most basic analytical and testing methods in various disciplines such as physics, chemistry, biology, and materials, and ultra-high resolution spectroscopy is the most cutting-edge technology in this field. [0003] Among the existing spectral analysis technologies, one is the scanning interferometer that mainly realizes high-resolution spectrum through FP interferometer, such as the scanning FP interferometer developed by Burleigh, and the serial 3+3 Brillouin developed by JRS Scientific Instruments. Scattering spectrometers, which can now achieve resolution Resolution conditions for sharpness>90 and contrast>10000. Because of its 3+3 multi-pass...

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01J3/28
Inventor 石锦卫赵芸赫李鸿暾魏巍威刘大禾
Owner BEIJING NORMAL UNIVERSITY
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