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A cross-beam two-dimensional micro-force measuring device based on psd

A measuring device and cross technology, applied in the direction of measuring device, measuring force, optical device, etc., can solve the problems that are not suitable for large-scale promotion, complex structure, high cost, etc., and achieve the reduction of external influence, good coherence, and collimation good sex effect

Active Publication Date: 2017-03-29
HARBIN INST OF TECH
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Problems solved by technology

The existing measurement methods have the problems of complex structure, large volume, high cost, and not suitable for large-scale promotion

Method used

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  • A cross-beam two-dimensional micro-force measuring device based on psd

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specific Embodiment approach 1

[0014] Specific implementation mode one: combine figure 1 As shown, it includes a measuring rod 1, a square measuring rod support 2, a cross beam 3, four mirrors 4, a quarter semiconductor laser 5, a base 6, and four two-dimensional PSD position sensors 7;

[0015] There is a ring groove 1-1 on the outer surface of the upper part of the measuring rod 1 for clamping with the measured hairspring 8; the lower end of the measuring rod 1 is vertically connected with the upper end surface of the center of the cross beam 3, and the cross beam 3 is arranged in a square frame for measuring Inside the rod support 2, the outer ends of the four beams of the cross beam 3 are respectively connected with the four corners of the square measuring rod support 2, and the four reflectors 4 are arranged under the four beams of the cross beam 3 respectively. On the end face, the reflective surfaces of the four reflective mirrors 4 are all facing downward; the quarter semiconductor laser 5 is arrang...

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Abstract

The invention, which belongs to the technical field of precise measurement, provides a PSD-based cross-beam two-dimensional micro-force measurement apparatus. An annular slot for clamp connection with a measured hairspring is formed in an external circular surface of an upper part of a measurement rod; the lower end of the measurement rod is connected with the top of the center of a cross bream vertically, so that outer ends of four beams of the cross beam are respectively connected with four corners of a square-frame-shaped measurement rod support; and four reflectors are respectively arranged on the bottom surfaces of the four beams of the cross beam. A four-division semiconductor laser is arranged on an upper end surface of a standing column at the center of a pedestal; and four two-dimensional PSD position sensors are respectively arranged on the upper end surfaces of four standing columns at the four corners of the pedestal. Therefore, four laser beams emitted by the four-division semiconductor laser are reflected by the four reflectors to detection windows of the four two-dimensional PSD position sensors. According to the invention, transfer from the force to micro displacement is carried out by using a measurement rod and the cross beam; and on the basis of the light-lever amplification principle, the two-dimensional PSD units are used for carrying out position measurement; and then the two-dimensional force applied on the measurement rod is detected.

Description

technical field [0001] The invention belongs to the technical field of precision measurement. Background technique [0002] With the continuous development of precision measurement technology, especially in the fields of precision instruments and high-tech cutting-edge product assembly, the stress on parts generated during assembly has attracted more and more attention. For example, the balance spring in a precision instrument, due to the assembly stress generated by the assembly, will have a huge interference with the measurement accuracy. In the assembly of some high-end mechanical watches, the assembly stress of the hairspring is a key factor for its accuracy; in the field of motors, the uneven force of the conductive hairspring will have a huge impact on the torque stability of the motor and will greatly reduce its service life. [0003] In order to ensure the performance of precision instruments and precision machinery, it is necessary to measure and adjust the key str...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G01L1/00G01B11/00
Inventor 李国苏星王波张鹏丁飞
Owner HARBIN INST OF TECH
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