Looking for breakthrough ideas for innovation challenges? Try Patsnap Eureka!

A Multi-channel π Network Quartz Crystal Testing System

A technology of quartz crystal and test system, applied in the direction of frequency measurement device, etc., can solve the problem of insufficient market demand, and achieve the effect of improving the wiring method, the simple and convenient measurement method, and reducing the impact

Active Publication Date: 2019-03-29
天津必利优科技发展有限公司
View PDF4 Cites 0 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

However, most of the crystal tests on the market are measured by a single π network, which is far from enough for the increasing market demand

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • A Multi-channel π Network Quartz Crystal Testing System
  • A Multi-channel π Network Quartz Crystal Testing System
  • A Multi-channel π Network Quartz Crystal Testing System

Examples

Experimental program
Comparison scheme
Effect test

Embodiment 1

[0023] The present invention is a multi-channel π network quartz crystal testing system, radio frequency switch, π network, measuring probe, measuring crystal holding plate, external control signal and external radio frequency signal are connected with radio frequency switch, radio frequency switch is connected with π network, π network A measuring probe is connected inside, a measuring crystal holding plate is placed on one side of the measuring probe, multiple π networks are placed on both sides of the measuring crystal holding plate, and each two π networks are connected to a radio frequency switch.

Embodiment 2

[0025] A multi-channel π network quartz crystal test system, the specific steps of use are:

[0026] (1) First select the RF switch, that is, the RF switch,

[0027] a. Since the measured crystal frequency is concentrated in the range of 1MHz to 200MHz, the frequency range is required to be greater than this range when selecting chips;

[0028] b. Since the RF input signal strength is 22dBm, the input power that the chip can withstand is required to be greater than 25dBm;

[0029] c. The insertion loss of the chip in the above frequency band should be less than 0.5dB, and the return loss should be less than -10dB. (Ensure the signal strength and waveform integrity reaching the crystal);

[0030] d. Choose a chip with I / O impedance of 50Ω to reduce signal reflection;

[0031] e. Choose a CMOS chip to avoid the interference of the crystal oscillator signal on the control;

[0032] (2) Connect the multi-channel π network quartz crystal test system, and then put the quartz cry...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

No PUM Login to View More

Abstract

The invention provides a multipath pai network quartz crystal test system and test method. The test system is characterized by comprising a radio frequency switch, a pai network, a test probe and a test crystal holding plate. External control signals and external radio frequency signals are in connection with the radio frequency switch. The radio frequency switch is connected to the pai network. The test probe is connected to the pai network. According to the invention, a prior crystal measurement method is changed and channel switching is realized through the external control signals and RF (Radio Frequency) switch, the measurement method is simple and convenient. Since parasitic parameters of the RF has great influence on crystal measurement, methods such as improving a wiring way, realizing impedance matching and the like are adopted for reducing the influence on measurement parameters.

Description

technical field [0001] The invention relates to the field of crystal testing, in particular to a multi-channel π network quartz crystal testing system. Background technique [0002] With the development of modern communication and computer technology, the production of electronic equipment is inseparable from the important component of quartz crystal. In addition to the precise cutting process, the production process also requires measuring instruments that can monitor the quartz crystal components in real time and detect finished products during the production process. The π network measurement method is a measurement method for quartz crystal components recommended by the IEC (International Electrotechnical Commission). However, most of the crystal tests on the market are measured by a single π network, which is far from enough for the increasing market demand. Contents of the invention [0003] According to the above technical problems, the present invention provides ...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
Patent Type & Authority Patents(China)
IPC IPC(8): G01R23/02
Inventor 杨军朱玮陈桂东靳爽
Owner 天津必利优科技发展有限公司
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Patsnap Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Patsnap Eureka Blog
Learn More
PatSnap group products

Browse by: Latest US Patents, China's latest patents, Technical Efficacy Thesaurus, Application Domain, Technology Topic, Popular Technical Reports.

© 2024 PatSnap. All rights reserved.Legal|Privacy policy|Modern Slavery Act Transparency Statement|Sitemap|About US| Contact US: help@patsnap.com