Looking for breakthrough ideas for innovation challenges? Try Patsnap Eureka!

A method and system for automatically searching pin positions applied to LCD white glass AOI testing

An automatic search and white glass technology, applied in the direction of instruments, nonlinear optics, optics, etc., can solve problems such as difficult management, low efficiency, and excessive use of fixtures, to waste storage space, waste maintenance and management costs, and solve measurement efficiency low effect

Active Publication Date: 2021-09-03
SHENZHEN QUANZHOU AUTOMATION EQUIP TECH CO LTD
View PDF5 Cites 0 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0005] The technical problem to be solved by the present invention is to provide a method and system for automatically searching pins for LCD white glass AOI testing in view of the above-mentioned defects of the prior art, which can realize automatic detection of COM pins and SEG pins of LCD white glass. Search and make correct judgments to solve the defects of inefficiency, excessive use of fixtures and difficult management in the process of manual connection judgment

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • A method and system for automatically searching pin positions applied to LCD white glass AOI testing
  • A method and system for automatically searching pin positions applied to LCD white glass AOI testing

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0046] In order to make the object, technical solution and advantages of the present invention more clear and definite, the present invention will be further described in detail below with reference to the accompanying drawings and examples. It should be understood that the specific embodiments described here are only used to explain the present invention, not to limit the present invention.

[0047] Such as figure 1 , figure 2 As shown, the present invention proposes a method and system for automatically searching pin positions applied to LCD white glass AOI testing, including the following steps:

[0048] Step S100, the power supply module is connected to the COM pin and the SEG pin of the LCD white glass.

[0049] In the steps of this implementation, the LCD white glass is powered by the power supply module. The LCD white glass has two types of pins: COM pin and SEG pin. Different images can be displayed on the display screen after the two kinds of pins are powered on. ...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

No PUM Login to View More

Abstract

The present invention provides a method and system for automatically searching pins for LCD white glass AOI testing, comprising the steps of: connecting a power supply module to COM pins and SEG pins of LCD white glass; supplying power to each pin to generate multiple patterns, and photographing And record all the patterns and associate them with the corresponding pins; select an image and compare it with all the other images one by one, and divide the images into two categories according to the comparison results; distinguish COM pins and SEG pins according to the two types of images. It can realize the automatic search and correct judgment on the COM pin and SEG pin of the LCD white glass, and solve the defects of low efficiency in the process of manual connection judgment, excessive use of fixtures and difficult management.

Description

technical field [0001] The invention relates to the field of LCD detection equipment, in particular to a method and system for automatically searching pin positions for LCD white glass AOI testing. Background technique [0002] LCD white glass is a component used for display in electronic equipment, including a glass screen for display and pins for connection. The pins are composed of COM pins and SEG pins. Due to the variety of LCD glass specifications, COM pins Unlike the arrangement of SEG pins, it is not possible to accurately determine which pin is the COM pin (pin position) and which pin is the SEG pin (pin position) during use. [0003] The existing LCD white glass is used to identify the correct COM pin and SEG pin. Since there are many pin positions on the LCD glass, it is necessary to manually connect them one by one, and then detect and distinguish different pins. There are many fixtures used in this way, requiring maintenance and management, and the measurement ...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
Patent Type & Authority Patents(China)
IPC IPC(8): G02F1/13
CPCG02F1/1309
Inventor 朱庆华黄双平华卫华
Owner SHENZHEN QUANZHOU AUTOMATION EQUIP TECH CO LTD
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Patsnap Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Patsnap Eureka Blog
Learn More
PatSnap group products