Method for simultaneously measuring specular reflectivity and diffuse reflectivity of material based on integrating sphere
A technology of diffuse reflectance and measurement method, which is applied in the field of simultaneous measurement of specular reflectance and diffuse reflectance of materials based on an integrating sphere, and can solve problems such as inability to measure specular reflectance and diffuse reflectance of samples
- Summary
- Abstract
- Description
- Claims
- Application Information
AI Technical Summary
Problems solved by technology
Method used
Image
Examples
Embodiment Construction
[0026] Exemplary embodiments of the present invention will be described in detail below with reference to the accompanying drawings. The description of the exemplary embodiments is for the purpose of illustration only, and in no way limits the invention and its application or usage.
[0027] The method for measuring sample specular reflectance, diffuse reflectance and total reflectance based on integrating sphere provided by the invention may further comprise the steps:
[0028] (1) Add an optical trap device on the conventional integrating sphere
[0029] Add an optical trap design at a suitable position on the conventional integrating sphere, such as figure 2 The optical trap 8 is shown. The proper position refers to the position on the integrating sphere corresponding to the incident hole with the sample hole as the reflection point and the sample plane normal as the axis of symmetry. The diameter of the opening of the optical trap 8 should be slightly larger than the d...
PUM
Abstract
Description
Claims
Application Information
- R&D Engineer
- R&D Manager
- IP Professional
- Industry Leading Data Capabilities
- Powerful AI technology
- Patent DNA Extraction
Browse by: Latest US Patents, China's latest patents, Technical Efficacy Thesaurus, Application Domain, Technology Topic, Popular Technical Reports.
© 2024 PatSnap. All rights reserved.Legal|Privacy policy|Modern Slavery Act Transparency Statement|Sitemap|About US| Contact US: help@patsnap.com