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Method for simultaneously measuring specular reflectivity and diffuse reflectivity of material based on integrating sphere

A technology of diffuse reflectance and measurement method, which is applied in the field of simultaneous measurement of specular reflectance and diffuse reflectance of materials based on an integrating sphere, and can solve problems such as inability to measure specular reflectance and diffuse reflectance of samples

Inactive Publication Date: 2015-08-12
BEIJING INST OF ENVIRONMENTAL FEATURES
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  • Abstract
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  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

Among them, the integrating sphere method is widely used due to its simplicity and ease of use, but the above-mentioned method based on the integrating sphere cannot use a set of integrating spheres to measure the specular reflectance, diffuse reflectance and total reflectance of the sample at the same time

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  • Method for simultaneously measuring specular reflectivity and diffuse reflectivity of material based on integrating sphere
  • Method for simultaneously measuring specular reflectivity and diffuse reflectivity of material based on integrating sphere
  • Method for simultaneously measuring specular reflectivity and diffuse reflectivity of material based on integrating sphere

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Embodiment Construction

[0026] Exemplary embodiments of the present invention will be described in detail below with reference to the accompanying drawings. The description of the exemplary embodiments is for the purpose of illustration only, and in no way limits the invention and its application or usage.

[0027] The method for measuring sample specular reflectance, diffuse reflectance and total reflectance based on integrating sphere provided by the invention may further comprise the steps:

[0028] (1) Add an optical trap device on the conventional integrating sphere

[0029] Add an optical trap design at a suitable position on the conventional integrating sphere, such as figure 2 The optical trap 8 is shown. The proper position refers to the position on the integrating sphere corresponding to the incident hole with the sample hole as the reflection point and the sample plane normal as the axis of symmetry. The diameter of the opening of the optical trap 8 should be slightly larger than the d...

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Abstract

The invention relates to a method for simultaneously measuring the specular reflectivity, the diffuse reflectivity and the total reflectivity of a material based on an integrating sphere. The specular reflectivity, the diffuse reflectivity and the total reflectivity of the material can be rapidly, conveniently and accurately obtained through the method. The method for measuring the reflectivity comprises the following steps: arranging a light trap on a traditional integrating sphere device, respectively measuring in the opening state and the closed state of the light trap, and carrying out data processing to obtain the specular reflectivity, the diffuse reflectivity and the total reflectivity of the material.

Description

technical field [0001] The invention relates to the field of photoelectric measurement, in particular to a method for simultaneously measuring specular reflectivity and diffuse reflectivity of materials based on an integrating sphere. Background technique [0002] The technical background related to the present invention will be described below, but these descriptions do not necessarily constitute the prior art of the present invention. [0003] As a physical quantity that characterizes the radiation characteristics of a material, the surface reflectance of a material is a very important parameter. In the field of aerospace, due to the harsh environment of outer space and the existence of solar radiation and other radiation in space, the coating on the surface of aerospace vehicles, the outer cladding of space objects such as satellites, etc. must consider their reflectivity to prevent space radiation from damaging them. , prolong its service life. In the field of national...

Claims

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Application Information

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IPC IPC(8): G01N21/55G01N21/47
Inventor 张小龙张广陈大鹏董雁冰
Owner BEIJING INST OF ENVIRONMENTAL FEATURES
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