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A flexible array eddy current probe and detection method for detecting conductive structure defects

A conductive structure, flexible array technology, used in measurement devices, material analysis by electromagnetic means, instruments, etc.

Inactive Publication Date: 2018-05-29
SHANGHAI MARITIME UNIVERSITY
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0004] The purpose of the present invention is to overcome the deficiencies of the prior art and provide a flexible array eddy current probe device and detection method for detecting surface defects of complex metal conductive structures

Method used

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  • A flexible array eddy current probe and detection method for detecting conductive structure defects
  • A flexible array eddy current probe and detection method for detecting conductive structure defects
  • A flexible array eddy current probe and detection method for detecting conductive structure defects

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Embodiment Construction

[0049] The present invention will be described in further detail below in conjunction with the accompanying drawings.

[0050] figure 1It is a top view of a flexible eddy current array probe 100 (hereinafter referred to as flexible probe or probe) provided by the present invention. The probe is provided with a plurality of coils 101 as excitation and sensing elements, and these coils 101 are grouped to form a plurality of coil assemblies ( figure 1 There are four coil assemblies in the example), so that each coil assembly contains one or more coils 101.

[0051] A large number of coils 101 are distributed on the probe in the form of a planar array, and are used to detect complex surface shape defects of conductive structures. Preferably, it is hoped that the array of coils can cover as much surface of the probe as possible, but the present invention does not exclude the implementation structure that the array of coils only covers a part of the surface of the probe.

[0052]...

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PUM

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Abstract

The invention relates to a flexible array eddy current probe and a detection method for detecting conductive structure defects. A plurality of coils arranged in a radial or circumferential plane array are embedded in the flexible structure of the flexible array eddy current probe; the flexible structure and the detected The three-dimensional surface shape of the component is adapted, and the surface of the probe is in close contact with the surface of the detected component to reduce lift-off interference; according to the set control logic, each coil in the probe is excited in time, and the one adjacent to the excited coil One or more coils are used for signal collection to obtain defect signals at the corresponding positions on the surface of the inspected part; the excitation and signal collection of each coil are sequentially rotated in spatial order and / or time order to achieve the purpose of rapid and full-coverage inspection.

Description

technical field [0001] The invention relates to a nondestructive detection probe device and a detection method thereof, in particular to an eddy current flexible array probe and a detection method for detecting complex surface defects of metal components. Background technique [0002] Cracks or defects on the surface or subsurface of some critical and complex-shaped metal parts, such as engine blades and aircraft fuselages, may lead to engine failure or aircraft crash. In order to assess the structural safety of equipment, information such as the number, location and shape of defects such as cracks on the surface of complex metal structures is required. Various detection methods such as magnetic particle testing, penetrant testing, and magnetic flux leakage testing have been widely used in the detection of cracks and defects. However, methods such as magnetic particle testing and penetrant testing are not capable of quantitatively detecting defects, and cannot obtain defect...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G01N27/90G01N27/904
Inventor 张思全
Owner SHANGHAI MARITIME UNIVERSITY
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