Looking for breakthrough ideas for innovation challenges? Try Patsnap Eureka!

Method for quantitatively analyzing roundness of star-like defocused spot generated on star sensor optical lens

A star sensor and quantitative analysis technology, applied in the direction of optical devices, testing optical properties, instruments, etc., can solve the problems of lack of quantitative analysis methods for the roundness of diffuse spots, etc., and achieve the effect of clear thinking, simple principle and strong operability

Active Publication Date: 2015-05-27
XI'AN INST OF OPTICS & FINE MECHANICS - CHINESE ACAD OF SCI
View PDF4 Cites 4 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0006] In order to solve the technical problem of the lack of quantitative analysis method for the roundness of the existing diffuse spot, the present invention provides a quantitative analysis method for the roundness of the diffuse spot of the star sensor, which makes this index quantitatively controllable, and provides a basis for the design of the optical lens of the star sensor. and provide basis for testing

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Method for quantitatively analyzing roundness of star-like defocused spot generated on star sensor optical lens
  • Method for quantitatively analyzing roundness of star-like defocused spot generated on star sensor optical lens
  • Method for quantitatively analyzing roundness of star-like defocused spot generated on star sensor optical lens

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0029] The present invention will be described in detail below in conjunction with the accompanying drawings.

[0030] figure 1 Shown is the flow chart of the technical route of the method for quantitatively calculating the roundness of the diffuse spot of the star sensor optical system of the present invention, and the quantitative analysis method for the roundness of the diffuse spot of the star sensor optical system comprises the following steps:

[0031] a) Obtain the diffuse spot energy map on the working surface of the star sensor optical lens, see the attached Figure 2.1 , the working surface of the optical system is defined as a defocused surface of the optical system, the size and energy distribution of the diffuse spot on this defocused surface meet the measurement requirements of the star sensor system, if the detector is not on the working surface of the optical system, the The obtained diffuse spot energy distribution is invalid and cannot meet the energy requir...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

No PUM Login to View More

Abstract

The invention relates to a method for quantitatively analyzing the roundness of a star-like defocused spot generated on a star sensor optical lens. The method comprises the following steps: (a) obtaining a diagram showing the energy distribution of the defocused spot generated on the working surface of the star sensor optical lens; (b) calculating total energy of the defocused spot according to the diagram showing the energy distribution of the defocused spot; (c) calculating the centroid position, containing the total energy, of the defocused spot; (d) drawing a closed energy contour in the diagram showing the energy distribution of the defocused spot, and calculating a roundness error of the defocused spot. The method can not only meet the requirement for image processing for the star sensor, but also effectively reflect the aberration distribution of the star sensor optical lens; the method can be utilized for quantitative evaluation of the design result of the star sensor optical lens and performance index detection; the method is simple in principle, clear in requirement, and high in operability.

Description

technical field [0001] The invention relates to a method for analyzing the circularity of the diffuse spot of the optical system of a star sensor. Background technique [0002] The star sensor is mainly used for star positioning and aircraft space attitude confirmation. The principle is that the light emitted by the star in the instantaneous field of view is imaged on the receiving target surface of the star sensor through the optical system, and then the image is processed and the star table is fitted and corresponding The software algorithm is used to obtain the inertial coordinates and instantaneous attitude of the aircraft. The optical system is the core component of the star sensor, which directly affects the performance accuracy of the star sensor. The optical system of the star sensor is different from the requirements of the general imaging objective lens. It is required that the diffuse spot of the star point image has good roundness, which is beneficial to the cal...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
Patent Type & Authority Applications(China)
IPC IPC(8): G01B11/24G01M11/02
Inventor 李巧玲严俊吴璀罡李晓妮
Owner XI'AN INST OF OPTICS & FINE MECHANICS - CHINESE ACAD OF SCI
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Patsnap Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Patsnap Eureka Blog
Learn More
PatSnap group products

Browse by: Latest US Patents, China's latest patents, Technical Efficacy Thesaurus, Application Domain, Technology Topic, Popular Technical Reports.

© 2024 PatSnap. All rights reserved.Legal|Privacy policy|Modern Slavery Act Transparency Statement|Sitemap|About US| Contact US: help@patsnap.com