An electronic system electromagnetic environment effect test method based on the reverberation chamber platform
An electronic system and electromagnetic environment technology, applied in the measurement of electricity, measurement of electrical variables, measurement devices, etc., can solve the problems of unclear physical meaning, inability to ensure the threshold value of electromagnetic environmental effects of test values, and inability to accurately guide the safety of electronic systems, etc. Achieve the effect of clear physical meaning, easy promotion and low cost
- Summary
- Abstract
- Description
- Claims
- Application Information
AI Technical Summary
Problems solved by technology
Method used
Image
Examples
Embodiment Construction
[0022] In order to make the technical problems to be solved in the present invention, technical solutions and beneficial effects clearer, the following will be combined with the attached figure 1 and specific embodiments are described in detail.
[0023] Refer to attached figure 1 , the test platform of this embodiment 1 is shown in the figure, and the test platform includes: a reverberation chamber, a signal source, a power amplifier, a directional coupler, a power meter, a transmitting antenna and a field strength meter.
[0024] Step 1. Build a test platform:
[0025] Place the electronic system to be tested and the field strength meter inside the working area in the reverberation chamber, and the field strength meter is connected to the computer outside the reverberation chamber through an optical fiber; set the signal source, power amplifier, directional coupler and power meter outside the reverberation chamber , the output end of the signal source is connected to the i...
PUM
Abstract
Description
Claims
Application Information
- R&D Engineer
- R&D Manager
- IP Professional
- Industry Leading Data Capabilities
- Powerful AI technology
- Patent DNA Extraction
Browse by: Latest US Patents, China's latest patents, Technical Efficacy Thesaurus, Application Domain, Technology Topic, Popular Technical Reports.
© 2024 PatSnap. All rights reserved.Legal|Privacy policy|Modern Slavery Act Transparency Statement|Sitemap|About US| Contact US: help@patsnap.com