Looking for breakthrough ideas for innovation challenges? Try Patsnap Eureka!

A cfar detector suitable for complex non-uniform clutter

A non-uniform clutter and detector technology, used in radio wave measurement systems, radio wave reflection/re-radiation, instruments, etc., can solve problems such as non-guaranteed, CFAR detector performance degradation, etc., to achieve strong practicability, solution The effect of drastic degradation of CFAR detector performance

Active Publication Date: 2017-01-04
UNIV OF ELECTRONICS SCI & TECH OF CHINA
View PDF3 Cites 0 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0005] However, these CFAR detectors are only suitable for uniform or partially uniform background environments. When the background environment is complex and rapidly changing, the CFAR detectors proposed so far cannot guarantee: Cells have IID characteristics, causing rapid performance degradation of CFAR detectors
In summary, most of the CFAR detectors proposed so far have great limitations in practical applications.

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • A cfar detector suitable for complex non-uniform clutter
  • A cfar detector suitable for complex non-uniform clutter
  • A cfar detector suitable for complex non-uniform clutter

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0044] In the summary of the invention, the cumulative probability distribution (cumulative distribution function) of each distribution described in step 1 is: Rayleigh distribution F(y)=1-exp(-y 2 / 2σ 2 ),y≥0, Log-normal: F(y)=Φ(ln(y)-μ / σ), y≥0, Weibull distribution F(y)=1-exp[-(y / B) C ],y≥0, K distribution F(y,b,v)=1-(y / 2b) v+1 ·K v+1 (y / b)·2 / Γ(v),y> 0,v> -1.

[0045] The specific implementation of the present invention is given below in conjunction with the actual measured data of the IPIX radar.

[0046] The measured data of the IPIX radar is the measured echo data of the IPIX radar of McMaster University in Canada. The radar is located on a cliff facing the Atlantic Ocean. The coordinates are 44°36.72′N, 63°25.41′W, 100 feet above sea level. The data contains 1900×160 data points, and the environment map is like Figure 4 As shown in (a), the thick black line surrounds the detection area, and the intersection is the position of the radar. The clutter amplitude diagram of the ra...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

No PUM Login to View More

Abstract

The invention discloses a CFAR detector suitable for complex non-uniform clutter, belongs to the field of radar signal processing, and relates to radar adaptive detection technology, especially an adaptive constant false alarm (CFAR) detection method. The terrain classification algorithm divides the radar irradiation area into uniform small areas, each small area is used as a reference window, and the reference windows of the same terrain are fused, and the terrain of each fused reference window is numbered to obtain Terrain classification for the entire radar coverage area. The detection unit and the resolution unit in the reference window are also independent and identically distributed under the non-uniform background of the detector, and the performance of the detector will not be affected by the non-uniform background. Therefore, the present invention solves the problem that the performance of the CFAR detector drops sharply when the radar scans complex areas in practical applications, and has the outstanding advantages of high precision and strong practicability.

Description

Technical field [0001] The invention belongs to the field of radar signal processing, and relates to radar adaptive detection technology, especially an adaptive constant false alarm (CFAR) detection method. Background technique [0002] Because CFAR detection can keep the false alarm probability basically unchanged in the changing clutter environment, it is widely used in radar target detection under strong clutter background. In the CFAR system, the unit to be detected (unit to be detected) is compared with an adaptive threshold. The adaptive threshold is usually estimated by using the data of the discrimination unit around the unit to be detected. Theoretically, the data in the reference window and the unit to be detected need to meet the independent and identical distribution (IID) characteristics. However, in the actual environment, the clutter background is often non-uniform, and the IID assumption is no longer valid, which will result in a significant drop in the traditiona...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
Patent Type & Authority Patents(China)
IPC IPC(8): G01S7/41G01S13/94G01S13/935
CPCG01S7/41G01S13/935
Inventor 易伟孔令讲彭馨仪宋海洋卢术平崔国龙张天贤杨建宇
Owner UNIV OF ELECTRONICS SCI & TECH OF CHINA
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Patsnap Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Patsnap Eureka Blog
Learn More
PatSnap group products

Browse by: Latest US Patents, China's latest patents, Technical Efficacy Thesaurus, Application Domain, Technology Topic, Popular Technical Reports.

© 2024 PatSnap. All rights reserved.Legal|Privacy policy|Modern Slavery Act Transparency Statement|Sitemap|About US| Contact US: help@patsnap.com