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Chip package and manufacturing method thereof

A technology of chip package and manufacturing method, which is applied in semiconductor/solid-state device manufacturing, electric solid-state devices, semiconductor devices, etc., can solve the problems of long process time and high production cost, and achieve the effect of increasing layout flexibility and improving quality

Active Publication Date: 2017-05-17
XINTEC INC
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

The traditional chip package manufacturing process involves multi-channel patterning process and material deposition process, which not only consumes production cost, but also requires a long process time

Method used

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  • Chip package and manufacturing method thereof
  • Chip package and manufacturing method thereof
  • Chip package and manufacturing method thereof

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Embodiment Construction

[0039] The fabrication and use of the embodiments of the present invention will be described in detail below. It should be noted, however, that the present invention provides many applicable inventive concepts, which can be embodied in various specific forms. The specific embodiments discussed herein are merely specific ways to make and use the invention, and do not limit the scope of the invention. Furthermore, repeated reference numerals or designations may be used in different embodiments. These repetitions are only for the purpose of simply and clearly describing the present invention, and do not represent any relationship between the different embodiments and / or structures discussed. Furthermore, when it is mentioned that a first material layer is located on or above a second material layer, it includes the situation that the first material layer is in direct contact with the second material layer or is separated by one or more other material layers.

[0040] The chip p...

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Abstract

A wafer encapsulation, comprising a wafer (100) having an upper surface (100a), a lower surface (100b), and a side wall; the upper surface (100a) of the wafer (100) comprises a sensing area or an element area (200), and a signal receiving pad area (160); a shallow groove structure is located outside the signal receiving pad area (160), and extends from the upper surface (100a) towards the lower surface (100b) along the side wall; the shallow groove structure comprises at least one first notch (220) and one second notch (230) below the first notch (220); a rewiring layer (280) is electrically connected to the signal receiving pad area (160) and extends to the shallow groove structure; a wiring (440) has a first end point (440a) and a second end point (440b); the first end point (440a) is electrically connected to the rewiring layer (280) in the shallow groove structure; and the second end point (440b) is used for external electrical connection. The wafer encapsulation reduces the cladding thickness (H3) of an encapsulation layer (460) therein, increases the sensitivity of the sensing area (200), and maintains the structural strength of the substrate (150).

Description

technical field [0001] The present invention relates to a chip packaging technology, in particular to a chip package and a manufacturing method thereof. Background technique [0002] The chip packaging process is an important step in the process of forming electronic products. In addition to protecting the chip therein from external environmental pollution, the chip package also provides an electrical connection path between the electronic components inside the chip and the outside world. The manufacturing process of traditional chip packages involves multi-channel patterning process and material deposition process, which not only consumes production cost, but also requires a long process time. [0003] Therefore, it is necessary to find a novel chip package and its manufacturing method, which can solve or improve the above-mentioned problems, and provide a simpler and faster chip packaging technology. Contents of the invention [0004] An embodiment of the present inven...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): H01L23/31H01L23/488H01L21/50
CPCH01L23/3121H01L24/05H01L29/0657H01L2224/02371H01L2224/02379H01L2224/04042H01L2224/05548H01L2224/05567H01L2224/32145H01L2224/32227H01L2224/48091H01L2224/48145H01L2224/48227H01L2224/73265H01L2924/10156H01L2924/181H01L2924/00014H01L2924/00012H01L2924/00
Inventor 何彦仕张恕铭刘沧宇黄玉龙林超彦孙唯伦陈键辉廖季昌
Owner XINTEC INC
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