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Method and device for detecting cloth flaws based on adaptive orthogonal wavelet transform

An orthogonal wavelet and detection method technology, which is applied in the direction of optical detection of defects/defects, can solve the problems of insufficient detection accuracy of cloth defects and the inability to ensure the matching of wavelet bases and fabric textures, etc., achieving good application prospects, high accuracy, overcoming the effect of slowness

Active Publication Date: 2014-12-10
HOHAI UNIV CHANGZHOU
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Problems solved by technology

In recent years, the automatic detection of fabric defects based on wavelet transform has been widely recognized and researched, but the wavelet bases used in the current defect detection methods based on wavelet analysis are all manually selected, which cannot guarantee the matching of wavelet bases and fabric textures. The accuracy of cloth defect detection is not enough

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  • Method and device for detecting cloth flaws based on adaptive orthogonal wavelet transform
  • Method and device for detecting cloth flaws based on adaptive orthogonal wavelet transform
  • Method and device for detecting cloth flaws based on adaptive orthogonal wavelet transform

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Embodiment Construction

[0026] The technical scheme of the present invention will be described in further detail below in conjunction with the accompanying drawings and specific embodiments, so that those skilled in the art can better understand the present invention and implement it, but the examples given are not intended to limit the present invention.

[0027] like figure 1 As shown, the cloth defect detection method based on adaptive orthogonal wavelet transform includes the following steps:

[0028] Step 1: Obtain a non-defective cloth image and input it into the computer as a standard cloth image. For example, an industrial camera can be used to capture a non-defective cloth image, and the acquired cloth image can be sent to the computer as a standard cloth image.

[0029] Step 2: Use the improved quantum revolving door quantum genetic algorithm to obtain the optimal wavelet base that matches the texture of the standard cloth image, and store the optimal wavelet base in the computer.

[0030]...

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Abstract

The invention discloses a method and a device for detecting cloth flaws based on adaptive orthogonal wavelet transform. Manual eye detection and an original automatic flaw detecting method in which wavelet transform is carried out after a wavelet basis is manually selected are replaced. The defects of traditional manual eye detection, such as low detection speed, low efficiency, false detection and high detection leaking rate are overcome. The problem of the original flaw detecting method based on wavelet transform that the detection precision is low as the wavelet basis is not optimized is solved. The optimal wavelet basis matched with a cloth texture is selected by an improved quantum rotating gate quantum genetic algorithm, the quantum rotating angle is regulated by a dynamic strategy, fine adaptive search is realized, the variety is enriched through introducing mutation operation, and the optimization capability of the algorithnm is improved through combining chaotic search. The flaw detecting method has the advantages of high speed, high accuracy, simplicity in operation and high efficiency and has great application prospects.

Description

technical field [0001] The invention relates to a cloth defect detection method and device based on adaptive orthogonal wavelet transform. Background technique [0002] In the early days, the quality inspection of cloth was usually carried out manually by inspectors. The inspection results were greatly affected by subjective factors such as the inspector’s proficiency, physical condition, and workshop environment. This method easily caused visual fatigue, high labor intensity, and existed Due to the disadvantages of low detection efficiency, high missed detection rate and false detection rate, it is urgent to develop a fast, efficient and high-accuracy automatic detection and identification system for cloth defects to replace manual visual inspection. [0003] Machine vision is the use of machine automation systems instead of human eyes for measurement and judgment. Compared with manual detection, machine vision can perform measurement, analysis and identification tasks for...

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01N21/88
Inventor 薛云灿杨亚顾菁杨启文王思睿
Owner HOHAI UNIV CHANGZHOU
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