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Thin film material Seebeck coefficient measuring instrument

A Seebeck coefficient and thin-film material technology, applied in the direction of material thermal development, can solve problems such as inability to test thin-film materials, and achieve the effect of increasing data reliability and test efficiency

Inactive Publication Date: 2014-10-22
BEIJING SOLAR ENERGY INST
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  • Abstract
  • Description
  • Claims
  • Application Information

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Problems solved by technology

[0004] The technical problem to be solved by the present invention is to provide a thin film material Seebeck coefficient measuring instrument to overcome the defect that existing instruments cannot test thin film materials, and realize the dynamic continuous measurement of Seebeck coefficient

Method used

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  • Thin film material Seebeck coefficient measuring instrument
  • Thin film material Seebeck coefficient measuring instrument
  • Thin film material Seebeck coefficient measuring instrument

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Embodiment Construction

[0030] The specific implementation manners of the present invention will be further described in detail below in conjunction with the accompanying drawings and embodiments. The following examples are used to illustrate the present invention, but are not intended to limit the scope of the present invention.

[0031] like figure 1 , figure 2 and image 3 As shown, the thin film material Seebeck coefficient measuring instrument provided in this embodiment includes a sample stage, a temperature control system and a data acquisition system. The sample stage includes a sample holder and a base, and the sample holder is divided into two parts for fixing the test samples, called hot and cold ends, respectively. The temperature control system includes a sensor, a temperature controller, a relay, a heater and a cooler, and the sensor, the heater and the cooler are all arranged on the sample holder, and the temperature controller collects the sensor signal through the The relay cont...

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Abstract

The invention relates to a measuring instrument in the field of thermoelectric performance tests, and especially relates to a thin film material Seebeck coefficient measuring instrument. The measuring instrument comprises a sample table, a temperature control system and a data collecting system. The sample table comprises a sample clamp and a base; wherein the sample clamp is divided into two parts, which are used to fix test samples and respectively named as the hot end and the cold end. The temperature control system comprises a sensor, a temperature controller, a relay, a heater, and a cooler, wherein the sensor, heater and cooler are all arranged on the sample clamp. The data collecting system comprises a gold electrode and a data collecting card. The provided Seebeck coefficient measuring instrument can measure the Seebeck coefficient of a thin film with a thickness more than 20 nm, can also measure the Seebeck coefficient of a block with a thickness less than 10 mm, is capable of carrying out continuous dynamic measurement at a speed of 10000 times / sec, and thus greatly improves the data reliability and measurement efficiency.

Description

technical field [0001] The invention relates to a measuring instrument in the field of thermoelectric performance testing, in particular to a Seebeck coefficient measuring instrument for thin film materials. Background technique [0002] Thermoelectric materials can convert thermal energy directly into electrical energy (Seebeck effect). It has the advantages of no moving parts, no noise, no pollution, reliable performance and long life. An important indicator to measure the thermoelectric performance of thin-film thermoelectric materials is the Seebeck coefficient, which is determined by the properties of the material itself. The higher the Seebeck coefficient, the better the thermoelectric performance of the material and the higher the thermoelectric conversion efficiency. In recent years, with special applications such as aerospace and deep space exploration, higher requirements for lightweight and high efficiency of thermoelectric materials have been put forward and the...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01N25/20
Inventor 王轩王涛刁训刚
Owner BEIJING SOLAR ENERGY INST
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