Looking for breakthrough ideas for innovation challenges? Try Patsnap Eureka!

Continuous-scanning structured light three-dimensional surface shape perpendicular measuring method

A technology of three-dimensional surface shape and vertical measurement, which is applied in the direction of measuring devices, optical devices, instruments, etc., can solve the problems of low accuracy, slow measurement speed, and large number of pictures, so as to ensure accuracy, avoid mutual influence, and reduce The effect of time and number of image acquisitions

Active Publication Date: 2014-09-24
SICHUAN UNIV
View PDF3 Cites 30 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0003] The present invention aims at the defects in the existing modulation degree measurement profilometry: the accuracy of the Fourier transform method is not high and the number of pictures required to be collected by the phase shift algorithm is large and the measurement speed is slow, and a new vertical measurement method is proposed method

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Continuous-scanning structured light three-dimensional surface shape perpendicular measuring method
  • Continuous-scanning structured light three-dimensional surface shape perpendicular measuring method
  • Continuous-scanning structured light three-dimensional surface shape perpendicular measuring method

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0018] The present invention will be described in further detail below in conjunction with the accompanying drawings, working principles and embodiments.

[0019] The principle diagram of the present invention is as figure 1 As shown, 1 is a projector, 2 is a stepping motor, 3 is a half mirror, 4 is a CCD camera, 5 is the object to be measured, 6 is the imaging surface of the projector at the initial position, and 7 is the projector at the initial position. The imaging plane at the middle position, 8 is the imaging plane when the projector is at the final position, and 9 is the reference plane. Under geometrical optics approximation, a sinusoidal grating is placed on the position of the object plane of the projection lens. Considering the ideal imaging situation, what is obtained on the image plane after imaging by the projection lens is still a sinusoidal grating. In the present invention, the circular projection N is adopted in turn. The frame (N≧3) relationship is a sinuso...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

No PUM Login to View More

Abstract

The invention provides a structured light three-dimensional surface shape perpendicular measuring method using a continuous scanning mode. When a measured objected is continuously scanned by an image surface of a structured light projector in the perpendicular direction, N frames (N>=3) N-step phase shift sinusoidal gratings are sequentially and cyclically imaged on the measured objected, a CCD camera synchronously obtains sinusoidal grating images subjected to object height modulation through a semi-transparent semi-reflective mirror in the same direction. Fourier transformation processing is conducted on the collected image set pixel by pixel along the time axis or the N-step phase shift algorithm is applied to continuous N frames (N>=3) phase shift sinusoidal grating images, so that distribution of modulation degrees of the sinusoidal grating images on the surface of the object is obtained. A three-dimensional surface shape of the object is rebuilt through a corresponding relation, which is obtained in advance through calibration, between the modulation degrees and the height. The continuous-scanning structured light three-dimensional surface shape perpendicular measuring method has the advantages of perpendicular measurement and three-dimensional surface shape high-precision measurement.

Description

technical field [0001] The invention relates to a structured light projection optical surface shape measurement technology, in particular to a three-dimensional surface shape vertical measurement method in which the projection direction and the fringe pattern detection direction are coaxial. Background technique [0002] Three-dimensional object surface profile measurement, that is, three-dimensional surface shape measurement, is of great significance in the fields of machine vision, biomedicine, industrial inspection, rapid prototyping, film and television special effects, product quality control and other fields. Optical three-dimensional sensing technology has been greatly developed due to its advantages of non-contact, high precision, and easy automatic control. Existing optical three-dimensional sensing methods mainly include: triangulation, Moiré Topography (MT for short), Fourier Transform Profilometry (FTP for short), and spatial phase detection (Spatial Phase Detect...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
IPC IPC(8): G01B11/25
Inventor 苏显渝钟敏陈文静游智胜卢明腾荆海龙
Owner SICHUAN UNIV
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Patsnap Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Patsnap Eureka Blog
Learn More
PatSnap group products