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Test method and device for data cluster

A technology of data clustering and testing methods, applied in data exchange networks, digital transmission systems, electrical components, etc., can solve the problems of difficult to find big data clusters, inaccurate test results, and high cost, and reduce labor input and costs. , Improve test quality, reduce the effect of missed test rate

Active Publication Date: 2014-09-03
SHENZHEN TENCENT COMP SYST CO LTD
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Problems solved by technology

[0004] However, in related testing methods, a test scenario similar to the production environment of a big data cluster is generally constructed, and the test is carried out in this test scenario, and the cost of constructing a test scenario is very high; due to the variety of businesses in the test scenario Parameters such as complexity, business complexity, and data volume are far from the production environment of big data clusters, which can easily lead to inaccurate test results, and it is difficult to find defects in the production environment of big data clusters, with a high rate of missed tests

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  • Test method and device for data cluster

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Embodiment Construction

[0034] The technical solutions in the embodiments of the present invention will be clearly and completely described below in conjunction with the accompanying drawings in the embodiments of the present invention. Obviously, the described embodiments are part of the embodiments of the present invention, not all of them. Based on the embodiments of the present invention, all other embodiments obtained by those of ordinary skill in the art without creative work shall fall within the protection scope of the present invention.

[0035] For ease of description, the data cluster will be introduced. Take the data cluster as a Hadoop cluster as an example. The Hadoop cluster includes HDFS (Hadoop Distributed File System) and a mapping protocol MapReduce system. The HDFS system is used to store files in the Hadoop cluster and provides high transfer rate access to applications. The data is suitable for applications with very large data sets. The MapReduce system is used to implement distrib...

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Abstract

The invention discloses a test method and device for data cluster, and belongs to the field of data cluster. The method comprises the following steps: obtaining a test authority which is isolated with the authority of a data cluster processing service; obtaining test computing resources according to the computing resources used by the data cluster processing service; obtaining current network operation flow and current network result data of the service; carrying out reduction processing on the current network operation flow to obtain test service flow; according to the test computing resources and the test authority, executing corresponding operation of each service instruction in the test service flow to obtain test result data; and carrying out consistency comparison on the current network result data and test result data and outputting comparison results. According to the test method and device for data cluster, the production environment of data cluster is directly utilized to carry out test without building a test scene additionally, thereby reducing human input and cost; the production environment of data cluster is subjected to full coverage, thereby improving coverage degree, furthermore, improving test quality, and reducing test missing rate.

Description

Technical field [0001] The invention relates to the field of data clusters, in particular to a testing method and device for data clusters. Background technique [0002] Big data cluster refers to a computer cluster composed of thousands of computers connected through a network that can jointly complete tasks such as data storage and data calculation. [0003] The amount of data carried by the big data cluster is huge, and the business complexity is also high. Therefore, in order to operate normally and stably, the big data cluster must have high stability. In order to ensure the high stability of the big data cluster, it is necessary to test the production environment of the big data cluster. [0004] However, in related test methods, test scenarios similar to the production environment of big data clusters are generally constructed. Tests are conducted in this test scenario. The cost of building test scenarios is very high; due to the diverse business of the built test scenarios ...

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): H04L12/26
Inventor 徐天华熊冬明蔡伟岗贺波马文韬
Owner SHENZHEN TENCENT COMP SYST CO LTD
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