Temperature control method of onboard equipment for system-level thermal vacuum test

Abstract

The invention relates to a temperature control method for equipment on a satellite in a system level thermal vacuum test. The method mainly includes a temperature range determining method for the equipment on the satellite, a high temperature determining method for the equipment on the satellite, an infrared heating cage manufacturing method before the test, a method for modifying the on-off state and the working state of the equipment on the satellite in the test process and an active temperature control heating loop starting / stopping threshold on the satellite, and a loop controlling method. According to the method, when the infrared heating cage is used for simulation based on external heat stream, temperature control of the equipment on the satellite is reasonable and effective, the temperature changing rate of the equipment on the satellite is increased, it is guaranteed that the temperature of the equipment does not exceed the checking and accepting level temperature range, and not only is the safety of the equipment on the satellite guaranteed, but also the purpose of eliminating potential early-stage defects of the satellite is effectively achieved.

Description

technical field [0001] The invention relates to a method for temperature control of on-board equipment in a satellite system-level thermal vacuum test, in particular to a temperature control method for on-board equipment based on using an infrared heating cage to simulate external heat flow, and belongs to the technical field of satellite thermal vacuum tests. Background technique [0002] The satellite thermal vacuum test is to verify the performance of the satellite on the ground under the specified vacuum (pressure) and thermal stress environment, and the performance of the satellite subsystems in various working modes in orbit, exposing possible potential early defects, and improving the reliability of the satellite in orbit. an effective means of sex. [0003] Under normal circumstances, before the system-level thermal vacuum test, a system-level thermal balance test will be carried out. According to the thermal design of the entire satellite, the extreme high and low t...

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Problems solved by technology

[0006] (3) The upper and lower temperature ranges of the whole star system-level test temperature are narrow, and the high temperature of the equipment is too low, and there may be potential defects in the thermal coupling and electrical connection surfaces of adjacent parts with large power consumption on the star, as well as in parts and components. If it is not easy to be exposed, there will be problems of under-testing, and the purpose of assessment will not be achieved

[0007] (4) During the heat balance test, the temperature of the entire spacecraft may be high or low, and the high temperature limit or low temperature limit may be close to or reach the upper and lower limit test temperature values ​​of the components. At this time, it cannot Taking the temperature value of the heat balance test as the reference temperature, expand a certain temperature up and down as the control temperature of the thermal vacuum test;

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