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Multi-probe spherical near field channel calibration device and method

A calibration method and multi-probe technology, applied to measuring devices, instruments, measuring electrical variables, etc., can solve problems such as inability to calibrate

Active Publication Date: 2014-03-12
CHINA ELECTRONIS TECH INSTR CO LTD
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  • Abstract
  • Description
  • Claims
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Problems solved by technology

However, the omnidirectional antenna has strong backward radiation. When the antenna is placed on the turntable, the distance from the ground is relatively close. When the ground is not treated, or the performance of the absorbing material is not good, the reflection of the ground will affect the omnidirectional The performance of the antenna is seriously affected, and it is no longer the characteristic of consistent amplitude and phase in all directions, so it cannot be used to calibrate

Method used

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  • Multi-probe spherical near field channel calibration device and method
  • Multi-probe spherical near field channel calibration device and method

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Embodiment 1

[0033] The invention discloses a multi-probe spherical near-field channel calibration device and method. The principle is that the directional antenna with small backward radiation and little influence from the ground is selected as the calibration antenna, and the horn antenna is specifically selected here. In a multi-probe spherical near-field measurement system such as figure 2As shown in the figure, at the same distance from all probe antennas, the calibration antennas are sequentially aimed at the probe antennas in the radial direction with the maximum radiation direction, and the vector network analyzer also sequentially records the channel reception signals of the aligned probes transmitted by the calibration antennas The data. Since the horn antenna is irradiated in the maximum direction every time, the difference in the calibration sky pattern is eliminated, and the difference in the path distance is eliminated by sending and receiving at the same distance, so the c...

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Abstract

The invention provides a multi-probe spherical near field channel calibration device and method. The device comprises a tool, a rotary shaft, a telescopic arm, an orienting antenna, a laser range finder, a first rotary table control system and a second rotary table control system; the tool is arranged on a rotary table and is provided with the rotary shaft; the telescopic arm is arranged on the rotary shaft and is provided with the orienting antenna; the orienting antenna is provided with the laser ranger finder; the first rotary control system is arranged to be connected with the tool and is used for controlling the tool to move left and right or up and down; the second rotary table control system is connected with the rotary table and is used for controlling the rotary table. By adopting the scheme, the orienting horn antenna is adopted as the calibration antenna to precisely calibrate the multi-probe spherical near field measuring data of the antenna, and the influence to the antenna performance caused by a backward ground when an omnidirectional antenna is used is avoided.

Description

technical field [0001] The invention belongs to the technical field of spherical near-field channel calibration, and in particular relates to a multi-probe spherical near-field channel calibration device and method. Background technique [0002] Antenna measurement comes along with antenna design, and is an important means to guide antenna design and verify antenna performance. In the field of antenna measurement, spherical near-field testing is an important means of antenna testing. The principle is: at a distance of several lambdas away from the antenna to be tested, use a probe with known electrical characteristics on the curved surface of the near area of ​​the antenna to be tested. Scan and sample the amplitude and phase data of the electromagnetic field, and then calculate the electrical characteristics of the far field of the antenna under test through rigorous mathematical transformation. For a spherical surface, the final scanning surface of the probe is a spherical...

Claims

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Application Information

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IPC IPC(8): G01R29/10G01R35/00
Inventor 周杨赵锐杜刘革常庆功王亚海
Owner CHINA ELECTRONIS TECH INSTR CO LTD
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