Automatic double-probe test platform based on bitmap tracking method

Abstract

An automatic double-probe test platform based on a bitmap tracking method mainly comprises a base, a carrying table, a first probe support, a second probe support, a main control computer, a first driving mechanism and a camera, wherein the first driving mechanism drives the carrying table to rotate in the horizontal plane and to be lifted up, the camera is arranged above the carrying table, the shooting direction of the camera faces downwards, the carrying table can rotate, be lifted up and move in the Y-axis direction, and the first probe support and the second probe support can carry out horizontal movements and horizontal mirror symmetry movements in the same direction. According to the automatic double-probe test platform based on the bitmap tracking method, the automatic locating of double probes is achieved through a bitmap control technology, the automated locating tests of two testing points of a sample is achieved accordingly, the labor intensity of testing personnel is reduced greatly, and the testing accuracy is improved. The automatic double-probe test platform based on the bitmap tracking method is novel in locating mode, the rotating movable type carrying table and the movable symmetrical open type double probe supports are utilized ingeniously, the probes can be located at any two testing points of the sample to be tested, and the automatic double-probe test platform can meet testing demands.

Description

technical field [0001] The invention relates to a dual-probe automatic test platform based on a bitmap tracking method. Background technique [0002] The probe station is a very important test platform for scientific research institutes and enterprises conducting research and production of electronic components. Probe test benches can be classified into single-probe, double-probe and multi-probe test benches according to the number of their probes. Among them, the double-probe test bench has become the most widely used probe station because it meets the basic current-voltage, capacitance-voltage and other test functions. At present, the double-probe test bench is mainly divided into two types: manual and automatic. The positioning of the probes of the manual test bench is mainly carried out by human visual observation. For smaller test points, due to the obstruction of the probe to the vision, it is difficult to locate the probe, which causes poor contact of the probe and...

AI Technical Summary

Problems solved by technology

For smaller test points, due to the obstruction of the probe to the vision, it is difficult to locate the probe, which makes the probe have poor contact and increases the contact resistance, which will cause inaccurate test results.

However, the existing automatic test platform cannot realize the flexible movement of the probe because it is aimed at the regular products of the enterprise, and does not have the ability to test irregular samples and fragments. For products of different specifications on the same production line, multiple test platforms are required. , increase production cost and reduce production efficiency

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