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An adapter board, multi-platform serial test system and method

A technology of serial testing and testing methods, which is applied in the direction of electronic circuit testing, measuring device casings, etc., to achieve the effects of liberating time arrangements, shortening test cycles, and improving the speed of research and development

Active Publication Date: 2016-12-28
DAWNING INFORMATION IND BEIJING +1
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  • Abstract
  • Description
  • Claims
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AI Technical Summary

Problems solved by technology

At present, the test software itself provides the sequential test setting function, but it is limited to the sequential testing of some test items on the current test motherboard

Method used

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  • An adapter board, multi-platform serial test system and method
  • An adapter board, multi-platform serial test system and method

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Embodiment Construction

[0020] The preferred embodiments of the present invention will be described below in conjunction with the accompanying drawings. It should be understood that the preferred embodiments described here are only used to illustrate and explain the present invention, and are not intended to limit the present invention, and in the absence of conflict, the present invention The embodiments and the features in the embodiments can be combined with each other.

[0021] The conventional test of QPI high-speed signal uses the XDP interface, using the boundary scan principle, the control signal is parallel, such as the test mode selection TMS, reset signal TRST, etc., the data signal is serial, the TDI signal is the input signal, and the TDO signal is the output signal .

[0022] At present, the internal test of the chip generally adopts the JTAG (Joint Test Action Group, Joint Test Action Group) international standard test protocol. Chips with a JTAG port have the following JATG pin defini...

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Abstract

The invention provides an adapter plate which comprises a plurality of serial XDP interfaces. Each XDP interface comprises a TDI input signal pin and a TDO output signal pin, the XDP interfaces are sequentially connected through the TDI input signal pins and the TDO output signal pins. The invention further provides a multi-platform serial test system which comprises the adapter plate and a test tool. One XDP interface of the adapter plate is connected with the test tool. The invention further provides a method for testing a tested device by means of the test system. According to the technical scheme, the aim that required test items can be completed at a time can be achieved by the automatic test function of test software, a tester can reasonably arrange the test time, the test period is shortened to a certain extent, and the developing speed of the product is improved.

Description

technical field [0001] The invention relates to the field of circuit board signal integrity testing, in particular to an adapter board, multi-platform serial testing system and method. Background technique [0002] For servers, workstations or personal computers, the motherboard is the most critical component, and the CPU is the core component. The CPU is responsible for the computing and processing capabilities of the entire system, and determines the performance of the system to a certain extent. For the server, in order to improve the overall performance of the system, there have been two-way, four-way, and designs that integrate more CPUs on one motherboard. Connect through a certain bus, for the Intel platform, it is the Quick Path Interconnect (QPI) high-speed bus. The signal quality of the QPI high-speed bus also determines the performance of the CPU, thereby determining the computing and processing performance of the entire system. Correspondingly, after the design...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G01R1/04G01R31/28
Inventor 张迎华李华陈佳
Owner DAWNING INFORMATION IND BEIJING
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