Device and method for measuring material diffuse reflectance by adopting gas absorption spectrum

Abstract

The invention provides a device and method for measuring material diffuse reflectance by adopting a gas absorption spectrum, belongs to the technical field of material diffuse reflectance measurement, and aims to solve the problem that the measurement of the material diffuse reflectance is not precise as the non-neutrality characteristic of an integrating sphere causes the variation of a spectrum on different wave bands. The device comprises a power supply, a laser light source, a focusing lens, an integrating sphere, a photoelectric detector, a data acquisition card and a computer, wherein the integrating sphere is provided with a light inlet and a light outlet, the included angle of the connection line of the center of the light inlet and the sphere center of the integrating sphere and the connection line of the center of the light outlet and the sphere center of the integrating sphere is right-angled; a to-be-detected material is uniformly sprayed on the inner wall of the integrating sphere. The method comprises the following steps: light beams emitted by the laser light source are interacted with gas of known concentration and the to-be-detected material inside the integrating sphere, and then are received by the photoelectric detector; an electrical signal output by the photoelectric detector is transmitted to the computer through the data acquisition card; the computer obtains the diffuse reflectance of the to-be-detected material through computation. The device and method are used for measuring the material diffuse reflectance.

Description

technical field [0001] The invention relates to a device and a method for measuring diffuse reflectance of materials by using gas absorption spectrum, and belongs to the technical field of measuring diffuse reflectance of materials. Background technique [0002] Reflectivity is an important characteristic of materials, and accurate measurement of material reflectivity is of great help to the study of material properties and structures. For the measurement of the reflectivity of specular materials, the reflectivity can be obtained by measuring the flux of incident light and the reflected light flux in the direction perpendicular to the material; for the measurement of diffuse reflectance of non-specular materials, spectral and infrared Fourier transform methods are usually used. [0003] Integrating spheres are usually used to measure illuminance. Another important application is to measure the diffuse reflectance of materials, mainly used to measure the diffuse reflectance o...

AI Technical Summary

Problems solved by technology

[0004] The present invention aims to solve the problem of inaccurate measurement of the diffuse reflectance of the material due to the non-neutral characteristics of the integrating sphere causing the spectrum to change in different bands in the existing method of measuring the diffuse reflectance of the material by using the integrating sphere. A device and method for measuring diffuse reflectance of materials using gas absorption spectroscopy

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