Looking for breakthrough ideas for innovation challenges? Try Patsnap Eureka!

WAT probe card intelligent processing system and method

An intelligent processing system and intelligent processing technology, applied in the field of WAT probe card management system, can solve the problems of inconvenient query and inability to check all cards in time, and achieve the effect of quick query, intelligent management and efficiency improvement.

Active Publication Date: 2013-10-02
SHANGHAI HUALI MICROELECTRONICS CORP
View PDF6 Cites 13 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

Moreover, after each probe card repair is completed, the engineer needs to manually reset the probe card needle insertion records on the machine, and manually record the probe card maintenance records on paper files. These paper records are very inconvenient to query. And it is not possible to check the status of all cards in time

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • WAT probe card intelligent processing system and method
  • WAT probe card intelligent processing system and method
  • WAT probe card intelligent processing system and method

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0035] The implementation of the present invention is described below through specific examples and in conjunction with the accompanying drawings, and those skilled in the art can easily understand other advantages and effects of the present invention from the content disclosed in this specification. The present invention can also be implemented or applied through other different specific examples, and various modifications and changes can be made to the details in this specification based on different viewpoints and applications without departing from the spirit of the present invention.

[0036] figure 1 It is a system architecture diagram of a WAT ​​probe card intelligent processing system of the present invention. Such as figure 1 As shown, a WAT ​​probe card intelligent processing system of the present invention at least includes: a statistics module 10 , a detection module 11 , a judgment module 12 and a prompt module 14 .

[0037] Among them, the statistical module 10...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

No PUM Login to View More

Abstract

The invention discloses an intelligent processing system and method for a WAT probe card. The method comprises the following steps: recording and counting probe card stitching frequency in real time; detecting accumulated stitching frequency of the probe card; judging whether the accumulated stitching frequency of the probe card exceeds a set upper limit or not, if yes, testing continues, if no, turning to the next step; sending out prompt information. According to the invention, when the accumulated stitching frequency of the probe card exceeds the upper limit, an operator is warned to replace the card, the efficiency is improved, fast inquiry to the maintenance record during the entire using process of the probe card as well as the management to the state of the probe card can be achieved, and intelligent management to the WAT probe card can be achieved.

Description

technical field [0001] The present invention relates to a WAT ​​probe card management system and method, in particular to a WAT ​​probe card intelligent processing system and method. Background technique [0002] The WAT (Wafer Acceptance Test, Wafer Acceptance Test) test generally needs to connect the actual device and the test instrument through a probe card to realize the test of devices of different sizes and shapes. With the development of semiconductor technology, the structure of WAT test is getting smaller and smaller, so the tip of the probe is getting smaller and smaller. After the probe card is used for a certain period of time, due to the wear of the needle tip, the needle tip will become thicker, so the probe needs to be repaired. When the wear of the needle tip reaches a certain level, the probe needs to be replaced (rebuild). The quality of the probe card can be well controlled by determining the maintenance frequency of the probe card by the number of needle...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
Patent Type & Authority Applications(China)
IPC IPC(8): G01R35/00
Inventor 周波莫保章席与凌
Owner SHANGHAI HUALI MICROELECTRONICS CORP
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Patsnap Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Patsnap Eureka Blog
Learn More
PatSnap group products

Browse by: Latest US Patents, China's latest patents, Technical Efficacy Thesaurus, Application Domain, Technology Topic, Popular Technical Reports.

© 2024 PatSnap. All rights reserved.Legal|Privacy policy|Modern Slavery Act Transparency Statement|Sitemap|About US| Contact US: help@patsnap.com