Looking for breakthrough ideas for innovation challenges? Try Patsnap Eureka!

Fully automatic memory module insertion and removal equipment based on motherboard testing

A memory stick, fully automatic technology, applied in metal processing equipment, metal processing, manufacturing tools, etc., can solve the problems of hidden safety hazards, low intelligence, inconvenient use, etc., to achieve convenient operation, high intelligence, The effect of improving production efficiency

Inactive Publication Date: 2016-04-27
SHENZHEN JUNYIHAO TECH
View PDF7 Cites 0 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

In order to solve the technical problems existing in the existing technology such as inconvenient use, low intelligence, low production capacity, strong limitations, and potential safety hazards

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Fully automatic memory module insertion and removal equipment based on motherboard testing
  • Fully automatic memory module insertion and removal equipment based on motherboard testing
  • Fully automatic memory module insertion and removal equipment based on motherboard testing

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0029] The technical solution of the present invention will be further specifically described below through the embodiments and in conjunction with the accompanying drawings.

[0030] figure 1 It is a structural block diagram of the present invention. Depend on figure 1 It can be seen that the fully automatic memory stick insertion and removal device based on the motherboard test mainly consists of a rack 1, an electric control box 2, a positioning work platform 8, an input and output mechanism 3, a movable magazine feeding mechanism 7, and a fixed magazine feeding mechanism 4 , a fixed manipulator mechanism 6, a movable manipulator mechanism 5, etc.; wherein the main body of the frame 1 and the electric control box 2 are integrated, and the frame 1 and the electric control box 2 are welded by Fangtong, and the frame 1 is provided with a column And the beam; the electric control box 2 is equipped with an electric control board, an air switch, an AC contactor, a programmable ...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

No PUM Login to View More

Abstract

The invention discloses mainboard test-based full-automatic plugging equipment for memory banks. The mainboard test-based full-automatic plugging equipment for the memory banks comprises a rack, an electric cabinet, a positioning working platform, a feeding / discharging mechanism, a movable clip feed mechanism, a fixed clip feed mechanism, a clip box, a fixed manipulator mechanism and a movable manipulator mechanism. The main body of the rack and the main body of the electric cabinet are integrally arranged; the positioning working platform is arranged above the electric cabinet; the movable clip feed mechanism and the fixed clip feed mechanism are respectively arranged at both sides of the positioning working platform; the feeding / discharging mechanism is arranged above the positioning working platform; and the fixed manipulator mechanism and the movable manipulator mechanism are arranged above the positioning working platform and are fixedly arranged at the top part of the rack. The equipment has the advantages that the use is convenient, the time and the labor are saved, and the memory banks and a testing tool cannot be damaged. The equipment can adapt to circuit mainboard with different dimensions, is capable of setting the number of different plugged memory banks and rapidly realizing the plugging of the memory banks on the circuit mainboards, and is rapid in testing and broad in market prospect.

Description

technical field [0001] The invention relates to the field of memory stick testing, in particular to a memory stick full-automatic insertion and removal device based on motherboard testing. Background technique [0002] The memory module is a channel connecting the CPU and other hardware, and plays the role of buffering and data exchange. A series of electrical tests are usually carried out before the main board of the memory stick leaves the factory. At present, the testing equipment usually used includes a testing table, on which a circuit board to be tested with a slot for the memory stick is arranged. When testing, it is necessary to first insert the memory stick into the memory stick slot on the circuit board to be tested, so that the metal sheet set in the slot is in electrical contact with the gold finger of the memory stick, and then the test is performed. Existing testing equipment usually realizes the plugging and unplugging of memory sticks on the main board manua...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
Patent Type & Authority Patents(China)
IPC IPC(8): B23P19/00
Inventor 唐春林林志福林国裕
Owner SHENZHEN JUNYIHAO TECH
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Patsnap Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Patsnap Eureka Blog
Learn More
PatSnap group products

Browse by: Latest US Patents, China's latest patents, Technical Efficacy Thesaurus, Application Domain, Technology Topic, Popular Technical Reports.

© 2024 PatSnap. All rights reserved.Legal|Privacy policy|Modern Slavery Act Transparency Statement|Sitemap|About US| Contact US: help@patsnap.com