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Optical heterodyne interference method for removing non-linear error based on square wave mean value method

A technology of nonlinear error and optical heterodyne interference, applied in the direction of using optical devices, measuring devices, instruments, etc., can solve the problems of complex system, large amount of calculation, poor real-time performance, etc.

Inactive Publication Date: 2013-09-25
CHANGCHUN INST OF OPTICS FINE MECHANICS & PHYSICS CHINESE ACAD OF SCI
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Problems solved by technology

[0005] In order to solve the technical problems existing in the existing laser heterodyne interferometry system, such as complex system, large amount of calculation, poor real-time performance, and inaccurate results, the present invention provides an optical heterodyne interferometry based on the square wave mean method to eliminate nonlinear errors, which can Eliminate the specific harmonic components of nonlinear errors or interference, and eliminate the need for precision optical adjustment devices and precision adjustment processes required to eliminate nonlinear errors, making this adjustment very easy, while greatly improving system performance and reducing costs

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  • Optical heterodyne interference method for removing non-linear error based on square wave mean value method
  • Optical heterodyne interference method for removing non-linear error based on square wave mean value method
  • Optical heterodyne interference method for removing non-linear error based on square wave mean value method

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[0055] The present invention will be described in further detail below in conjunction with the accompanying drawings.

[0056] The system that implements the phase detection based on square wave average value, phase-locked loop filtering and optical heterodyne interferometry with weighted superposition in 3-dimensional linear space to eliminate nonlinear errors of the present invention can be divided into an optical part and a subsequent electronic signal processing part . The principle of the optical part is as follows figure 1 As shown, on the basis of an original optical part, the present invention adds the part in the dotted line box in the figure. First, the working principle of the optical part of the original heterodyne interferometry system is described: the laser light is emitted by the laser 101, and enters the acousto-optic device 103 through the first part of the mirror 102, and is frequency-shifted and then emitted to the second part of the mirror 114, and the tr...

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Abstract

The invention belongs to the field of optical heterodyne interference, and discloses an optical heterodyne interference method for removing a non-linear error based on a square wave mean value method. The method comprises the steps that at least three paths of signals are obtained from an optical path where non-linear error interference elements exist, phase angles, on signal frequency elements to be removed, of the periodic non-linear error interference elements of the at least three paths of signals are made to be different in a corresponding circumference angle range or in a corresponding circumference angle range after integral multiples of circumference angles are removed, meanwhile, signals are filtered through a filter in an analog electrical signal channel, a phase difference between each path of measuring signals and a reference signal is computed by the adoption of the square wave mean value method, and then analog-digital conversion, displacement calculation, weighting and iterative processing are conducted so as to remove or restrain the interference elements conveniently. The optical heterodyne interference method for removing the non-linear error based on the square wave mean value method can remove specific harmonic elements of the non-linear error or the interference, the regulation process is very easy, system performance is improved, and cost is reduced.

Description

technical field [0001] The invention belongs to the field of optical heterodyne interferometry (Heterodyne Interferometry) measurement, and specifically relates to an optical heterodyne interferometry method based on a square wave average value and a phase-locked loop filtering method without fine adjustment to eliminate nonlinear errors. Background technique [0002] The laser heterodyne interferometry system can be used to measure physical quantities such as displacement and length, and is one of the best nanometer measurement methods. The system converts the measured displacement into the frequency or phase change of the heterodyne signal, and then measures this change. Since the frequency of the heterodyne signal is much lower than the optical frequency, the photoelectric signal is easy to process and can be electronically fine-tuned. Points to achieve higher measurement resolution, the resolution can reach picometer (pm) or better. [0003] However, nonlinearity proble...

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Application Information

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IPC IPC(8): G01B11/02
Inventor 李也凡孙强郭帮辉白越
Owner CHANGCHUN INST OF OPTICS FINE MECHANICS & PHYSICS CHINESE ACAD OF SCI
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