Paper inspection method and device
A technology of electronic test papers and relative positional relationships, applied in the field of data processing, can solve problems such as increasing the error rate of answering questions
- Summary
- Abstract
- Description
- Claims
- Application Information
AI Technical Summary
Problems solved by technology
Method used
Image
Examples
Embodiment Construction
[0039] Hereinafter, the present invention will be described in detail with reference to the drawings and examples. It should be noted that, in the case of no conflict, the embodiments in the present application and the features in the embodiments can be combined with each other.
[0040] This embodiment provides a marking system, including figure 1 The scanner and the server shown, wherein, the scanner is used to scan test papers into electronic test papers; the server connected to the scanner, the server includes: memory, used to store electronic test papers; processor, connected to the memory, used to identify Scoring for items in the electronic test paper. Preferably, the above-mentioned score can be a positive score or a negative score, that is, the score on the test paper can be the final score (positive score) of the question or the deducted score (negative score) of the question. ), so the above score is just an expression. According to different scoring methods of di...
PUM
Abstract
Description
Claims
Application Information
- R&D Engineer
- R&D Manager
- IP Professional
- Industry Leading Data Capabilities
- Powerful AI technology
- Patent DNA Extraction
Browse by: Latest US Patents, China's latest patents, Technical Efficacy Thesaurus, Application Domain, Technology Topic, Popular Technical Reports.
© 2024 PatSnap. All rights reserved.Legal|Privacy policy|Modern Slavery Act Transparency Statement|Sitemap|About US| Contact US: help@patsnap.com