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Method for measuring carrier-envelop phase positions of few-circle femtosecond laser pulses

A technology of femtosecond laser and measurement method, which is applied in the field of femtosecond optical measurement, can solve the problems that CEP has a great influence, cannot be ignored, and the measurement method is not perfect, etc., and achieves good operability, simple experimental equipment and wide application prospects Effect

Active Publication Date: 2015-05-13
HANGZHOU INSTITUTE OF OPTICS AND FINE MECHANICS
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Problems solved by technology

[0004] The above method ignores the influence of focusing and nonlinear effects on the CEP value, but both theory and experiments have shown that the nonlinear effect in the process of the interaction between the light field and the medium has a great influence on the CEP and cannot be ignored
Therefore, the existing CEP measurement methods are not perfect enough

Method used

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  • Method for measuring carrier-envelop phase positions of few-circle femtosecond laser pulses
  • Method for measuring carrier-envelop phase positions of few-circle femtosecond laser pulses
  • Method for measuring carrier-envelop phase positions of few-circle femtosecond laser pulses

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Embodiment Construction

[0024] The present invention will be further described below in conjunction with the accompanying drawings and embodiments, but the protection scope of the present invention should not be limited thereby.

[0025] ① Please refer to figure 1 , figure 1 It is a structural schematic diagram of a terahertz and a terahertz detection device for waveform reversal generated by laser air filamentation of the present invention. It can be seen from the figure that the laser light from the Ti:Sapphire laser 1 is divided into a transmitted beam and a reflected beam through the beam splitter 2. The reflected beam is reflected by the total reflection mirror 12, the delay device 13, and the lens 14, and then enters the Beam combiner 15, the transmitted light passes through the optical parameter amplification system 3, the lens 4, the hollow fiber 5, and the silicon wafer 6 to produce stable light to be measured with CEP, and a quartz wedge is set in the forward direction of the light to be m...

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Abstract

Disclosed is a method for measuring carrier-envelop phase positions of few-circle femtosecond laser pulses. The method includes the steps of arranging a device, measuring and calculating the absolute value of a laser carrier-envelope phase position to be measured. By the method, accuracy of the carrier-envelop phase positions of the few-circle femtosecond laser pulses can be directly measured, and a reliable route is provided for measuring the absolute value of the carrier-envelop phase positions.

Description

technical field [0001] The invention belongs to the field of femtosecond optical measurement, in particular to a method for measuring the carrier-envelope phase of period-level femtosecond laser pulses. Background technique [0002] The important parameter of the periodic level (pulse duration is only a few optical cycles) laser pulse - carrier-envelope phase (Carrier-envelop Phase, hereinafter referred to as CEP), refers to the maximum value of the pulse envelope and the electric field oscillation under the envelope The relative phase between the maxima of , which determines the instantaneous electric field strength of the laser pulse. CEP plays a decisive role in the interaction between periodic laser pulses and matter, such as the generation of high-order harmonics and attosecond pulses, optical synthesis, and coherence control. Especially in the field of attosecond science and optical frequency standard measurement, CEP plays a pivotal role. With the continuous deepeni...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G01J9/00G01J11/00
Inventor 许荣杰白亚宋立伟刘鹏李儒新
Owner HANGZHOU INSTITUTE OF OPTICS AND FINE MECHANICS
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