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Probe and fixture

A technology for connecting fixtures and probes, used in measuring devices, instruments, measuring electricity and other directions, can solve the problems of probe pre-compression deviation and compression size deviation, and achieve the effect of suppressing reaction force and preventing deformation

Active Publication Date: 2013-07-31
NIDEC-READ CORPORATION
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

However, in this structure, due to the influence of the variation in the length of the probes, the compressed size of each probe used for preloading varies, resulting in variation in the preloading of each probe

Method used

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Examples

Experimental program
Comparison scheme
Effect test

no. 1 approach

[0044]

[0045] refer to figure 1 , the schematic configuration of the connection jig using the probe according to the first embodiment of the present invention will be described. The connection jig 10 includes: a first probe holding part 12, a second probe holding part 14, an electrode part 15 (refer to Figure 5 ) and electrode holding member 16. The first and second probe holding members 12 and 14 are made of insulating plate-shaped members such as resin or ceramics. The first and second probe holding members 12 and 14 are held with a predetermined distance apart by the rod-shaped support member 11 and the spacer 11s mounted around the rod-shaped support member 11 .

[0046] A plurality of through-holes 12h corresponding to the first through-holes according to the present invention are formed in the first probe holding member 12, and the tip of the probe 20 inserted into the plurality of through-holes 12h and held is guided to a predetermined position. . The second pr...

no. 2 approach

[0086] refer to Figure 7 and Figure 8 , the probe according to the second embodiment of the present invention will be described. Such as Figure 7 and Figure 8 As shown, the probe 40 includes: an outer conductor 41 , an inner conductor 42 and a fixing portion 43 .

[0087] The outer conductor 41 is electrically conductive and has a substantially cylindrical form (cylindrical form in this embodiment). The inner conductor 42 is electrically conductive and has a substantially cylindrical shape (cylindrical shape in this embodiment), and has a sharp abutment end 42c at its front end 42a that abuts on a connection point of the inspection object. Such an inner conductor 42 is inserted into the outer conductor 41 in such a manner that its front end portion 42 a protrudes from the front end side of the outer conductor 41 and its rear end portion 42 b does not protrude from the rear end side of the outer conductor 41 , and the inner conductor 42 is in contact with the outer cond...

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PUM

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Abstract

The invention provides a probe, which does not demage the spring character when the probe is against the connecting point of the detected object, and effectively inhibit the prepressed counter-acting force of the probe when installed on the connecting clamp. In the probe (20), an outer conductor (22) has electrical conductivity with barrel shape. On the peripheral wall of the outer conductor (22), a first spring part (221) with smaller spring constant is located at the front end of a second spring part (222), and the two spring parts are arragned and telescoped along the axial directon of the probe (20) with different spring constants. A fixing part (26) is located a middle part (22c) between the first spring part (221) and the second spring part (222) and is fixed with the conductor (24) at the inner side.

Description

technical field [0001] The present invention relates to a probe and a connection jig used in a connection jig for electrically connecting to a connection point provided on an inspection object. Background technique [0002] Such a connection jig is called an inspection jig or an inspection card, for example, and has a plurality of probes through which a current or an electric signal from an inspection device or the like is supplied to a predetermined connection point on the inspection object, and the detection is performed from the connection point. The electric signal can be detected to detect the electrical characteristics between the connection points, and the operation test of the continuity check or the leakage check, etc. can be performed. [0003] As the inspection object, there are printed wiring boards, flexible substrates, ceramic multilayer wiring boards, electrode plates for liquid crystal displays or plasma displays, or various substrates such as packaging subst...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01R1/067G01R1/04
CPCG01R1/06722G01R1/06733G01R1/07371G01R31/2886
Inventor 太田宪宏
Owner NIDEC-READ CORPORATION
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