Noise parameter measurement uncertainty evaluation method based on multi-chip module (MCM)

Abstract

The invention discloses a noise parameter measurement uncertainty evaluation method based on a multi-chip module (MCM) and belongs to the field of measurement metering. The method includes utilizing an equivalent noise parameter equation as a measurement model for noise parameter measurement uncertainty evaluation, utilizing physical quantity measured from a measurement platform to calculate the function equation and obtain data reflecting equivalent noise parameter distribution condition, leading out noise parameter and noise parameter distribution from the equivalent noise parameter and finally obtaining uncertainty for noise parameter measurement. The method effectively combines digital random simulation, physical measurement boundary criterion and least square method optimization criterion, and enables noise parameter uncertainty evaluation to be effective, real and reliable. The method satisfies the national standard, and is flexible in simulation mode, multiple in applicable measurement system variety and strong in universality.

Description

technical field [0001] The invention discloses an MCM-based noise parameter measurement uncertainty evaluation method, which belongs to the field of test and measurement. Background technique [0002] "Guide to the Expression of Uncertainty in Measurement" (Guide to the Expression of Uncertainty in Measurement, referred to as GUM) has been promoted and applied for many years since it was released in 1993, and has become a uniform standard followed by all countries when expressing measurement results. In China, the measurement technical specification JJF1059-1999 "Evaluation and Expression of Measurement Uncertainty" is equivalent to the method stipulated by GUM. It has played an important role in guiding and regulating the use and evaluation of measurement uncertainty throughout the country. , The expression of measurement results in the test field is in line with international standards. [0003] With the rapid development of science and technology and the continuous stand...

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Problems solved by technology

[0007] 1. In the application of measurement uncertainty, the combined uncertainty or expanded uncertainty is mainly used, and it is stated in Supplementary Appendix 1 of ISO / IEC Guide 98-3 that the combined uncertainty can be given by the MCM method. NIST In the open literature, only the MCM method is used to evaluate the type B uncertainty, which brings certain difficulties to the application of uncertainty

[0008] 2. The measurement uncertainty must be under the same inclusion factor to be comparable. NIST does not give an inclusion factor

[0009] 3. No uncertainty is given for the measurement results in the packaged device fixture

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