Given threshold-based numerical control finished product circuit board performance degradation evaluation method

Abstract

The invention discloses a given threshold-based numerical control finished product circuit board performance degradation evaluation method which comprises the steps of: (a) selecting an evaluation template to implement an acceleration performance degradation test, and measuring surface insulation resistance value; (b) executing test data fitting, and establishing an acceleration performance degradation model of a test template; (c) calculating the pseudo failure life of the test template based on the failure threshold by combining the acceleration performance degradation model; (d) selecting a life distribution model of the test template, and calculating the parameters of the life distribution model by utilizing a pseudo failure life fitting test; and (e) confirming the life distribution probability density function of the test template, and calculating the average lifetime of the test template to complete the performance degradation evaluation process of a circuit board. The given threshold-based numerical control finished product circuit board performance degradation evaluation method overcomes the defects of failure data in the existing reliability evaluation technology, saves the time and the cost used for evaluating the reliability, and is beneficial to the maintenance plan and optimization of a system.

Description

technical field [0001] The invention belongs to the technical field of printed circuit boards, and more specifically relates to a performance degradation evaluation method of a numerically controlled finished circuit board based on a given threshold. Background technique [0002] Printed circuit boards are the main components of electronic products. They are widely used in various fields such as aviation, numerical control, computers, and automation instruments. Their quality performance and stability are crucial to the products. In order to evaluate and examine its life and reliability indicators, accelerated test methods must be used. Accelerated life test is to promote the failure of the sample in a short period of time under stress conditions exceeding the environmental conditions of use, so as to predict the reliability in the normal use environment, but do not change the failure mechanism of the test sample. However, for printed circuit boards with long life and high ...

AI Technical Summary

Problems solved by technology

However, for printed circuit boards with long life and high reliability, within a certain test period, even through accelerated tests, only relatively few or no failures can be observed.

Therefore, there is a problem that it is difficult to effectively evaluate its life and reliability

[0003] The study found that the failure mechanism of most products can be traced back to the potential performance degradation process of the product, so in a sense, it can be considered that the performance degradation eventually leads to product failure or failure.

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