Looking for breakthrough ideas for innovation challenges? Try Patsnap Eureka!

Examination method for different-party IP (internet protocol) containing client party chip antenna effect

A technology of chip antenna and inspection method, which is applied in the field of inspection of the chip antenna effect on the customer side, can solve problems such as different results, customers are at a loss, and the layout cannot be checked by AntennaLEF, so as to protect intellectual property rights and avoid repeated data modification.

Active Publication Date: 2013-03-06
SHANGHAI HUAHONG GRACE SEMICON MFG CORP
View PDF7 Cites 6 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

And because the data read by the two is different, it is likely to lead to different DRC results, causing customers to be at a loss, such as figure 1 shown
[0011] In addition, after placing and routing, some customers will use the layout tool to modify the layout and routing results, and the modified layout cannot be checked in the layout and routing tool with Antenna LEF

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Examination method for different-party IP (internet protocol) containing client party chip antenna effect
  • Examination method for different-party IP (internet protocol) containing client party chip antenna effect
  • Examination method for different-party IP (internet protocol) containing client party chip antenna effect

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0028] like figure 2 As shown, the inspection method of the antenna effect of the client side chip containing the different party IP of the present invention comprises the following steps:

[0029] The first step is to identify all input and output interfaces (Ports) in the IP module layout, including information such as the name and location of the interface;

[0030] Use the Perl program to read the physical GDSII layout of the IP module in a binary manner, and store each layer of the physical layout of the IP module, the information that this layer is called, and the Text (text) mark on each layer through the hash structure;

[0031] The top layer (Topcell) in the GDSII layout is calculated through the hash structure, and the Text information in the Topcell is fed back to the user operation interface. The Text information in the Topcell is the input and output interface (Port) in the IP module layout;

[0032] The second step is to select the input and output interface (P...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

No PUM Login to View More

Abstract

The invention discloses an examination method for different-party IP (internet protocol) containing client party chip antenna effect. The method includes following steps: step one, identifying all input and output interfaces in an IP module layout; step two, selecting the input and output interface used for generating final data; step three, taking the input and output interface as a starting point to extract out all lines related to the antenna effect along the lines connecting every interface from top to bottom; step four, enabling the extracted lines to generate a GDSII formatted file capable of being read by a user layout tool and providing the file for a client; and step five, synthesizing the GDSII formatted file into a main chip by the client for physical layout verification of the final data. By the method, data which can be directly used for antenna design rule examination by a client party can be generated, and a design company can perform antenna effect examination close to an entity through tools before the data are given out, so that repeat data modification caused by violation of design rules by the client can be avoided.

Description

technical field [0001] The invention relates to a method for checking a chip, in particular to a method for checking the antenna effect of a client-side chip containing a different IP. Background technique [0002] In the process of chip (Wafer) manufacturing, due to the relationship of PLASM (plasma) implantation, a large amount of charge accumulation may be transferred to the gate-level region through the conductor layer exposed on the Wafer surface, resulting in damage to the gate-level oxide film and affecting the device. Yield, this phenomenon is called "antenna effect". [0003] In order to avoid the antenna effect, generally after the physical layout is completed, software tools are used to perform Antenna (antenna) DRC (Design Rule Check) inspection on the chip. However, due to the protection of their own intellectual property rights, the supplier of IP (a chip unit) module generally does not provide the design company with a complete layout of the IP module to ensu...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
IPC IPC(8): G01R31/28
Inventor 潘炯施龙海童洪亮沈景龙倪凌云孙长江
Owner SHANGHAI HUAHONG GRACE SEMICON MFG CORP
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Patsnap Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Patsnap Eureka Blog
Learn More
PatSnap group products