Looking for breakthrough ideas for innovation challenges? Try Patsnap Eureka!

Measurement and calculation methods of digital modulation error

An error measurement, digital modulation technology, applied in the field of information transmission, which can solve problems such as increased signal distortion, potential quality problems of information and communication equipment, etc.

Active Publication Date: 2013-02-06
TELECOMM METROLOGY CENT OF MINIST OF IND & INFORMATION TECH +1
View PDF1 Cites 5 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0006] 2. The measured signal V 2 (t) and the reference signal V 3 (t) The corresponding BIT sequences are all BT 2 , so that even if a bit error occurs at the receiving end, V 2 (t) and V 3 (t) There will be a certain similarity, that is, the traditional EVM measurement principle cannot correctly reflect the distortion of the part of the signal that has already experienced a bit error. Strictly speaking, the traditional EVM index is only when the bit error rate is 0 or Very hours make sense
[0007] The problem that this kind of defect brings to engineering measurement is: in the case of deep distortion, the actual distortion of the signal is intensifying, but the parameters such as EvmRms cannot correctly reflect this distortion, causing engineers to mistakenly think that the signal quality is still good, which is It is easy to cause potential quality problems of information and communication equipment

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Measurement and calculation methods of digital modulation error
  • Measurement and calculation methods of digital modulation error
  • Measurement and calculation methods of digital modulation error

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0024] In order to make the object, technical solution and advantages of the present invention clearer, the present invention will be further described in detail below in conjunction with specific examples.

[0025] The present invention first proposes a new VSA measurement structure, which is analyzed from the physical concept, such as figure 1 As shown, the real signal error is actually relative to the initial information bit stream BT 1 In terms of the traditional VSA structure, it can be considered to improve the traditional VSA structure: directly derive the transmission bit sequence BT from the transmitting end 1 , from BT 1 directly generate the reference signal V 3 (t), the improved structure such as image 3 shown. image 3 It is a new VSA measurement principle block diagram proposed by the present invention.

[0026] Compare figure 1 and image 3 It can be seen that the improvement of the new scheme mainly lies in: the information bit sequence recovered by the...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

No PUM Login to View More

Abstract

The invention provides measurement and calculation methods of a digital modulation error. The method is characterized in that reference orthogonal baseband waveforms V3(t) at a terminal of a vector signal analyzer (VSA) is directly generated by an information bit sequence BT1 at a lead-in measured transmitting terminal, so that BIT sequences corresponding to a measured signal V2(t) and a reference signal V3(t) are bit sequences BT2 for receiving judgment, thereby generating an error code phenomenon at a receiving terminal. In addition, signal distortion is reflected correctly by measuring an error rate and modifying traditional EvmRms parameters. The method provided by the invention is utilized to solve defects produced by deep distortion signals measured by a traditional VSA measurement structure.

Description

technical field [0001] The invention relates to information transmission technology, in particular to a method for measuring and calculating digital modulation errors of digital modulation signals. Background technique [0002] There are defects in the principle of traditional vector signal analyzers. Digital modulation signals are an important carrier of modern information transmission and have become one of the cornerstones of the information society, such as QPSK signals used in mobile communication systems and QAM signals used in digital cable TV. The digital modulation error parameters include: vector error magnitude (EVM), magnitude error (Magnitude Error) and so on. The main tool for measuring digital modulation errors is a vector signal analyzer (VSA), and the main principles of VSA measurement are as follows figure 1 Shown: figure 1 It is the measurement principle block diagram of traditional VSA. [0003] The inventor's experiments demonstrate the theoretical an...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
Patent Type & Authority Applications(China)
IPC IPC(8): H04B17/00H04B17/309
Inventor 周峰张睿王南卢民牛陆冰松周镒郭隆庆冉志强赵晓昕孙景禄张媛媛
Owner TELECOMM METROLOGY CENT OF MINIST OF IND & INFORMATION TECH
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Patsnap Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Patsnap Eureka Blog
Learn More
PatSnap group products

Browse by: Latest US Patents, China's latest patents, Technical Efficacy Thesaurus, Application Domain, Technology Topic, Popular Technical Reports.

© 2024 PatSnap. All rights reserved.Legal|Privacy policy|Modern Slavery Act Transparency Statement|Sitemap|About US| Contact US: help@patsnap.com