Prediction system and method for film yield

Abstract

The invention provides a prediction system and method for film yield, which are used for detecting defects generated during the manufacture of optical films to calculate the predicted yield of products. The prediction system for the film yield comprises a first inspection part which is used for detecting the defects on the optical films in executing a specific step of the manufacturing process of the optical films and generating a first defect data comprising the positions of the detected defects; a second inspection part which is used for detecting the defects on the optical films in executing steps different from the specific step and generating a second defect data comprising the position of the detected defects; a data consolidation part which consolidates the first defect data and a second defect data; and a yield prediction system which is used for calculating the predicted yield of the optical films based on a predicted cutting positions and cutting sizes of the optical films according to the defect data obtained by the consolidation of the data consolidation part.

Description

technical field [0001] The present invention relates to a film yield prediction system and method for detecting defects generated during the manufacture of an optical film and calculating the expected yield of a product. Background technique [0002] Optical film is a film used in the manufacture of liquid crystal display (LCD, Liquid Crystal Display), and is a term used to collectively refer to polarizing film, diffusing film, reflective film, prism film, etc. Such an optical film is usually produced by being wound on a roll, and then the film wound on the roll is cut into a size desired by the user and provided to the user. At this time, when a defect occurs in the film, the part is discarded in the acceptance process, and the number and location of such defects become important factors in determining the yield of the optical film. [0003] In order to confirm defects of such optical products, in-line automatic optical inspection systems are generally used in the industry...

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Problems solved by technology

[0004] However, equipment such as the conventional online automatic optical inspection system can only identify the existence and location of defects, but cannot predict the yield of polarizing film

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