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Test task scheduling method based on critical paths and tabu search

A test task and critical path technology, applied in special data processing applications, instruments, electrical digital data processing, etc., can solve the problem of test task scheduling problem that has no application, etc., to simplify the neighborhood search range, reduce computing time, and narrow down neighborhood effect

Active Publication Date: 2015-05-13
BEIHANG UNIV
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Problems solved by technology

At present, the critical path has been applied to the problems of workshop scheduling, traveling salesman, etc., but it has not been applied to the test task scheduling problem.

Method used

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  • Test task scheduling method based on critical paths and tabu search
  • Test task scheduling method based on critical paths and tabu search
  • Test task scheduling method based on critical paths and tabu search

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Embodiment Construction

[0027] The present invention will be further described in detail below in conjunction with the accompanying drawings and examples of implementation.

[0028] A kind of test task scheduling method based on critical path and taboo combination of the present invention, the process is as follows figure 1 As shown, including the following 7 steps:

[0029] Step 1: Identify and analyze test tasks.

[0030] Test task set T={t 1 ,t 2 ,...,t i ,...,t N},t i is the i-th test task in the test task table, N is the total number of test tasks; instrument resource set R={r 1 ,r 2 ,...,r j ,...,r M}, r j is the jth instrument in the instrument resource table, and M is the total number of instruments. test task t i (i=1,2,…,N) The total number of corresponding test schemes is w i , where the test scenario s i (1≤s i ≤w i ) occupies an instrument resource set of j=1,...,M, if occupying instrument r j , then λ j =1, otherwise it is 0.

[0031] test task t i test plan s i T...

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Abstract

The invention discloses a test task scheduling method based on critical paths and tabu search, belonging to the field of automatic testing system parallel test task scheduling. The method comprises the following steps of: firstly determining and analyzing a test task, initializing parameter setting, subsequently determining an initial test task sequence by adopting a priority coding mode, finding an optimal test scheme selection set under the test task sequence by using a method of tabu combination critical path so as to find an optimal test task sequence and a corresponding test scheme selection set through iteration of multiple times. According to the method, an initial task sequence which meets the constraint is provided while the tabu search is applied to solve a test task scheduling problem, an adjacent domain search range of the tabu is simplified, the redundant adjacent domain search operation is reduced, and the operation efficiency and optimizing efficiency of the test task scheduling method are improved ultimately.

Description

technical field [0001] The invention belongs to the field of parallel test task scheduling of an automatic test system, and in particular relates to a test task scheduling method based on critical path and tabu search. Background technique [0002] Automatic test technology is the guarantee of complex systems and instruments, and is now widely used in semiconductor, radio, aerospace and other fields. With the rapid development of science and technology, the test requirements are constantly changing, the maintenance cost of the test system is increasing, and problems such as resource conflicts and deadlocks often occur between test tasks. Therefore, in order to reduce maintenance costs and improve test efficiency and system compatibility, test task scheduling, as the core of automatic test technology, has become a research hotspot. [0003] Test task scheduling requires that different test tasks be allocated appropriate resources through scheme selection, so that the test ti...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G06F17/30
Inventor 路辉刘静王晓腾
Owner BEIHANG UNIV
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