Looking for breakthrough ideas for innovation challenges? Try Patsnap Eureka!

Integral analog-to-digital converter

An analog-to-digital converter and integrator technology, applied in analog-to-digital conversion, code conversion, instruments, etc., can solve the problem of difficulty in realizing the last point, and achieve the effect of reducing complexity and design difficulty

Active Publication Date: 2013-01-09
北京立博信荣科技有限公司
View PDF3 Cites 7 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

However, the requirements of the first three points often make the last point difficult to achieve

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Integral analog-to-digital converter
  • Integral analog-to-digital converter
  • Integral analog-to-digital converter

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0024] In order to make the above objects, features and advantages of the present invention more comprehensible, the present invention will be further described in detail below in conjunction with the accompanying drawings and specific embodiments.

[0025] refer to figure 1 , shows a schematic structural diagram of an integral analog-to-digital converter of the present invention, the analog-to-digital conversion process includes auto-zero and integral conversion, and the integral analog-to-digital converter includes:

[0026] The buffer 101 is used to increase the driving force of the analog-to-digital converter input signal and the reference signal;

[0027] Integrator 102, for integrating the output signal of the buffer;

[0028] A comparison module 103, configured to compare the output of the integrator with a reference voltage to generate a flag signal; and

[0029] The auto-zero auxiliary circuit 104 is used to eliminate the offset voltage of the buffer, the integrator...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

No PUM Login to View More

Abstract

The invention provides an integral analog-to-digital converter which comprises a buffer, an integrator, a comparing module and a self-zeroing auxiliary circuit, wherein the buffer is used for increasing a driving force of an input signal and a reference signal of the analog-to-digital converter; the integrator is used for integrating the output signal of the buffer; the comparing module is used for comparing the output voltage of the integrator with a reference voltage so as to generate a marking signal; the self-zeroing auxiliary circuit is used for eliminating offset voltages of the buffer, the integrator and the comparing module during a self-zeroing period. By storing the offset voltages into an integrating capacitor and a self-zeroing capacitor, the offset voltages of the buffer, the integrator and the comparing module are eliminated, no extra frequency compensating circuits need to be added during the realization process, and the complexity and the design difficulties of circuits are reduced significantly.

Description

technical field [0001] The invention relates to the technical field of analog-to-digital conversion, in particular to an integral analog-to-digital converter. Background technique [0002] Many applications require the conversion of continuous analog signals to discrete digital signals. ADC design typically involves a tradeoff between resolution (the number of discrete levels contained in a digitized signal) and speed (the number of samples that can be sampled per second). [0003] In practical applications, the integrating ADC has the characteristic that it is not affected by the process change of the integrating resistor and integrating capacitor, but its accuracy will be affected by the offset voltage of the buffer op amp, the offset voltage of the integrating op amp, and the offset voltage of the comparator. In order to achieve high precision, it must Eliminate these offset voltages, so the integral ADC must go through auto-zero before each conversion, in order to be ap...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
Patent Type & Authority Applications(China)
IPC IPC(8): H03M1/50
Inventor 王晶于海魁
Owner 北京立博信荣科技有限公司
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Patsnap Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Patsnap Eureka Blog
Learn More
PatSnap group products