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Sequential accelerated degradation test optimal design method based on relative entropy

An accelerated degradation test and optimized design technology, applied in calculation, special data processing applications, instruments, etc., to achieve the effect of reducing test design errors, saving test time and sample size

Active Publication Date: 2012-11-14
BEIHANG UNIV
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  • Application Information

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Problems solved by technology

[0014] However, so far, there is no research on the optimal design method of sequential accelerated degradation test

Method used

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  • Sequential accelerated degradation test optimal design method based on relative entropy
  • Sequential accelerated degradation test optimal design method based on relative entropy
  • Sequential accelerated degradation test optimal design method based on relative entropy

Examples

Experimental program
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Embodiment

[0154] For a superluminescent diode (SLD), the step stress sequential accelerated degradation test optimization design is implemented based on the relative entropy, and the steps are as follows:

[0155] Step 1. Using Bayesian theory to establish an optimal design method for accelerated degradation experiments based on relative entropy.

[0156] Step 1 is the basis of Step 2 and Step 3 of the present invention. The specific implementation of Step 1 will be described below by taking the optimization of the initial test scheme according to the method of Step 1 in Step 3 as an example.

[0157] (1) Determine the product performance degradation model and acceleration model, and then give the prior distribution of model parameters based on historical data. Based on the design information, historical data, and similar product information of the tested product SLD, the model and assumptions are given as follows,

[0158] 1. Assumption:

[0159] A1: The degradation trend is monotono...

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Abstract

The invention discloses a sequential accelerated degradation test optimal design method based on relative entropy, comprising the specific steps of: step 1, utilizing a Bayesian theory to establish an accelerated degradation test optimal design method based on the relative entropy; step 2, establishing a sequential truncation judging method; and step 3, carrying out sequential accelerated degradation test based on the relative entropy. According to the method disclosed by the invention, a 'sequential design' is introduced to an optimal design of the accelerated degradation test for the first time and the sequential accelerated degradation test optimal design method is provided. With the adoption of the 'sequential design', not only can prior information before the test be sufficiently utilized, but also performance degradation information obtained in the test is gradually utilized, and a test design error caused by that the deviation between the prior information and a product real condition is larger is reduced, so that compared with a partial optimal design and Bayesian optimal design of the accelerated degradation test, the sequential accelerated degradation test optimal design method based on the relative entropy has the greater advantage.

Description

technical field [0001] The invention is a sequential accelerated degradation test optimization design method based on relative entropy, belongs to the technical field of accelerated degradation tests, and is used to solve technical problems in the field of reliability and system engineering. Background technique [0002] In today's reliability engineering at home and abroad, the life and reliability evaluation of long-life and high-reliability products such as aerospace electronic products and optoelectronic products has become a research problem. Accelerated Life Testing (ALT) and accelerated degradation Test (Accelerated Degradation Testing, ADT) is the key technology to solve this problem. Among them, ADT overcomes the shortcoming of ALT that only records product failure data, and has become a research hotspot in the field of reliability testing. [0003] Accelerated degradation test technology must first face the design problem of the test plan in the engineering applic...

Claims

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Application Information

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IPC IPC(8): G06F17/50
Inventor 葛蒸蒸李晓阳范宇王立志
Owner BEIHANG UNIV
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