Phase microscopic device for transmission type samples and phase microscopic method

Abstract

The invention discloses a phase microscopic device for transmission type samples and a phase microscopic method. Based on a coaxial holographic light path, an amplified real image of a transmission type object, after being scanned by using a small hole, is taken as object light, scattering spots are formed on a target surface of a detector at a distance and interfered with plane waves in the same direction, the light intensity distributions formed when the scattering spots exist separately and the scattering spots are interfered with reference light are respectively recorded when the small hole is located at different positions, meanwhile, a situation that the reference light is not changed is ensured, and the light intensity distribution of the reference light is recorded once. A reproductive image (including amplitude and phase) with a size far larger than the size of the target surface of the detector is obtained in a mode of carrying out an iterative operation by using a computer. A reproductive image produced in the invention not only has the interference of zero-order images and conjugate images, but also can carry out phase microscopic imaging on a transmission type sample with a size far larger than the size of the target surface of the detector because a mode of small-hole scanning and prevention is adopted; and because of the introduction of the reference light, compared with a common iterative algorithm, the convergence speed is faster.

Description

technical field [0001] The invention relates to imaging and phase measurement of a transmission type sample, in particular to a transmission type sample phase microscope device and a phase microscope method. Background technique [0002] Since the image obtained by the microscope is often a combination of a clear in-focus image and other out-of-focus images, in order to maximize the resolution of the microscope, the sample needs to be made into very thin slices, but as the sample becomes thinner, light transmission At the same time, the contrast of the image observed by the ordinary microscope will decrease accordingly. When the sample is thin to a certain extent, the entire field of view will be basically uniform, and it is difficult to observe the detailed structure of the object. The Zernike phase contrast microscope solves the observation problem of phase objects and promotes the progress of related science to a large extent. Although phase-contrast microscopy solves th...

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Problems solved by technology

[0011] The CDI algorithm has a simple structure and can theoretically reach the resolution of the diffraction limit, but this imaging method requires the sample to be an isolated object, and theoretically it cannot distinguish the object itself from its conjugate and the convolution of itself and other functions combination, it is often difficult to obtain an ideal reconstructed image for slightly complex objects, which greatly limits its application range

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