Transformer test data measurement system and measurement locating method thereof based on wireless network

Abstract

The invention discloses a transformer test data measurement system and a method thereof based on a wireless network. The system comprises a monitoring center, a data acquisition center and a data transfer center; the monitoring center comprises a monitoring center computer, the data acquisition center comprises a plurality of data acquisition controllers and a plurality of special measurement devices, and the data transfer center comprises a Zigbee center wireless module and a Zigbee terminal wireless module; command and data are transferred between the monitoring center and the data acquisition center through the data transfer center; the special measurement devices are used for marking a corresponding actual position at a measurement position selected by the data acquisition controller so as to measure a target sample, transmitting back data through interfaces of the special measurement devices to the data acquisition controller after obtaining a measurement result, and receiving measurement result data; data is processed by the data acquisition controller after obtaining the data, and position information and the measurement result are stored; and then, selection of a next group of measurement positions and measurement operations are sequentially executed, until all the positions are measured.

Description

technical field [0001] The invention relates to a transformer test data measuring device and method thereof, in particular to a wireless network-based system that uses a data acquisition control system to measure multiple sets of transformer test data and a measurement and positioning method thereof. Background technique [0002] Most of the existing transformer test data measurement systems integrate various equipment into one body, and obtain data through the communication interface of each equipment. Once the wiring is completed, automatic measurement and data collection can be realized, and reports can be generated. The main problem is equipment integration. After being integrated, the portability is reduced, and the transformer must be placed in the area near the test system for testing. When using the test system for process test measurement, it is difficult to perform measurement on the production line; the existing transformer test system can only perform one test at ...

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Problems solved by technology

[0002] Most of the existing transformer test data measurement systems integrate various equipment into one body, and obtain data through the communication interface of each equipment. Once the wiring is completed, automatic measurement and data collection can be realized, and reports can be generated. The main problem is equipment integration. After being integrated, the portability is reduced, and the transformer must be placed in the area near the test system for testing. When using the test system for process test measurement, it is difficult to perform measurement on the production line; the existing transformer test system can only perform one test at a time. The equipment integrated into the system that is not used by this group of tests can only be idle, which causes waste of equipment, and low equipment utilization will undoubtedly increase the cost of the test; although scattered test equipment can solve the above-mentioned poor flexibility and utilization of equipment Low problem, but does not have the function of data organization, can only rely on artificial organization of data to form a complete product test report, which greatly increases the workload of data processing after the test

Moreover, the existing test system generally does not have the test plan management function, but only collects and manages data for the test items, without managing and coordinating the test items or products to be done. The existing measuring equipment generally measures one position at a time and then For storage or printing, the measurement position cannot be clearly marked or the marking process is complicated, and it is not suitable for multiple sets of output transformer structure data records

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