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Analog circuit fault diagnosis method based on differential evolution algorithm and static classification of echo state network

A technology of echo state network and differential evolution algorithm, applied in the direction of calculation, measurement of electricity, measurement of electrical variables, etc., can solve the problem of low diagnosis accuracy, achieve the effect of high diagnosis accuracy and improve adaptability

Active Publication Date: 2011-11-23
HARBIN INST OF TECH
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Problems solved by technology

[0005] The present invention aims to solve the problem of low diagnostic accuracy of analog circuit fault diagnosis using traditional neural network, thereby providing an analog circuit fault diagnosis method based on differential evolution algorithm and static classification of echo state network

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  • Analog circuit fault diagnosis method based on differential evolution algorithm and static classification of echo state network
  • Analog circuit fault diagnosis method based on differential evolution algorithm and static classification of echo state network
  • Analog circuit fault diagnosis method based on differential evolution algorithm and static classification of echo state network

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specific Embodiment approach 1

[0048] Specific implementation mode 1. Combination figure 1 Illustrate this specific embodiment, the analog circuit fault diagnosis method based on differential evolution algorithm and echo state network static classification, it is realized by the following steps:

[0049] Step 1, using a unit pulse signal to stimulate the analog circuit to work, obtain a circuit response signal to be diagnosed, and collect the unit pulse response output signal of the analog circuit;

[0050] Step 2, using the wavelet transform method to process the unit impulse response output signal of the analog circuit collected in step 1 to obtain fault characteristics;

[0051] Step 3. The fault characteristics obtained in step 2 are used as data samples, and input into the echo state network, and the differential evolution algorithm is used for training, and an analog circuit fault diagnosis model is established;

[0052] Step 4. Using wavelet transform method to process the response signal of the cir...

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Abstract

The invention relates to an analog circuit fault diagnosis method based on a differential evolution algorithm and static classification of an echo state network, solving the problem of lower diagnosis precision in the methods for diagnosing analog circuit faults by adopting the traditional neural networks. The method comprises the following steps: adopting unit pulse signals to excite an analog circuit to work to obtain circuit-to-be-diagnosed response signals and acquiring unit pulse response output signals of the analog circuit; adopting a method of wavelet transform to process the acquiredunit pulse response output signals of the analog circuit, taking the obtained fault features as the data samples, inputting the fault features into the echo state network, adopting a differential evolution algorithm to train the fault features and building an analog circuit fault diagnosis model; and adopting the method of wavelet transform to process the circuit-to-be-diagnosed response signals to obtain fault data and inputting the fault data into the analog circuit fault diagnosis model to obtain and output the fault diagnosis results. The method is suitable for fault diagnosis of the analog circuit.

Description

technical field [0001] The invention relates to an analog circuit fault diagnosis method. Background technique [0002] In electronic equipment, analog circuits are the weakest link most likely to fail, and fault diagnosis of analog circuits can improve the maintainability of electronic equipment. Due to the lack of a good fault model for analog circuits, the complex nonlinear relationship between circuit response and component parameters, and the limitation of the number of measuring points, the research on fault diagnosis of analog circuits is not yet mature. In this case, artificial intelligence-based methods are introduced into analog circuit fault diagnosis, which treat analog circuit fault diagnosis as a pattern recognition problem. Due to its good nonlinear mapping ability and self-learning adaptability, neural network is most commonly used in the intelligent diagnosis method of analog circuits. However, the traditional neural network, such as the multi-layer percep...

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Application Information

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IPC IPC(8): G01R31/02G06F19/00
Inventor 彭宇赵光权郭嘉杨智明雷苗王建民
Owner HARBIN INST OF TECH
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