Looking for breakthrough ideas for innovation challenges? Try Patsnap Eureka!

Method for eliminating fundamental waves and odd harmonics of nonlinear errors in wave detection method

A non-linear error and odd harmonic technology, applied in the direction of measuring devices, instruments, special recording/indicating devices, etc., can solve problems such as difficulties, and achieve the effect of powerful functions, wide application range, and increased cost

Inactive Publication Date: 2011-09-28
CHANGCHUN INST OF OPTICS FINE MECHANICS & PHYSICS CHINESE ACAD OF SCI
View PDF0 Cites 0 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

But the problem is that if you want to reduce the nonlinear error by an order of magnitude, such as reducing the nonlinear error to one percent, you need hundreds of times the reentrant optical path, and generally speaking, this is difficult

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Method for eliminating fundamental waves and odd harmonics of nonlinear errors in wave detection method
  • Method for eliminating fundamental waves and odd harmonics of nonlinear errors in wave detection method
  • Method for eliminating fundamental waves and odd harmonics of nonlinear errors in wave detection method

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0034] Such as figure 1 As shown, taking the optical application as an example, on the basis of the original laser heterodyne interferometry, the method of the present invention adds the part in the dotted line box in the figure to cooperate with the original laser heterodyne interferometry To realize the principles and functions described in the present invention.

[0035] First, the working principle of the original laser heterodyne interferometry method is explained: the laser is emitted by the laser 1, and the transmitted light through the first beam splitter 2 enters the acousto-optic device 3, and is frequency-shifted by the acousto-optic device 3 and then exits to the second The beam splitter 4, the transmitted light through the second beam splitter 4 is reflected back by the measuring prism 5, and is incident on the third beam splitter 6, the light reflected by the third beam splitter 6 and the light reflected by the second reflector 10 pass through the first The pola...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

No PUM Login to View More

Abstract

The invention discloses a method for eliminating fundamental waves and odd harmonics of nonlinear errors in a wave detection method, which belongs to the technical field of precision measurement. In the method, in a laser heterodyne interferometry measurement process, interference light carrying measured physical quantity information is received by two photoelectric detectors; phases of periodic nonlinear errors in the two detected paths are made to be opposite by regulating or setting an optical path difference; and then the fundamental wave components and the like dominated in the periodic nonlinear errors are eliminated in subsequent electronic processing. The method of the invention has the advantages of eliminating the main parts of the nonlinear errors, improving precision and reducing the nonlinear errors by more than 2 to 3 orders of magnitude.

Description

technical field [0001] The invention belongs to the technical field of using wave methods in precision measurement technology, including heterodyne interferometry, and relates to a method for eliminating fundamental waves and odd harmonics of nonlinear errors in wave detection methods. Background technique [0002] In the real material world, there are many material carriers in the form of motion such as fluctuations. We can use light waves or other forms of electromagnetic waves as an example to discuss without loss of generality. Laser heterodyne interferometry is a typical method that uses fluctuations to measure. [0003] Laser heterodyne interferometry can be used to measure physical quantities such as displacement and vibration, and is currently one of the best nanometer measurement methods. This method is to convert the measured displacement into the frequency or phase change of the heterodyne signal, and then measure this change. Since the frequency of the heterodyn...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
Patent Type & Authority Patents(China)
IPC IPC(8): G01D3/036
Inventor 孙强李也凡
Owner CHANGCHUN INST OF OPTICS FINE MECHANICS & PHYSICS CHINESE ACAD OF SCI
Features
  • Generate Ideas
  • Intellectual Property
  • Life Sciences
  • Materials
  • Tech Scout
Why Patsnap Eureka
  • Unparalleled Data Quality
  • Higher Quality Content
  • 60% Fewer Hallucinations
Social media
Patsnap Eureka Blog
Learn More

Browse by: Latest US Patents, China's latest patents, Technical Efficacy Thesaurus, Application Domain, Technology Topic, Popular Technical Reports.

© 2025 PatSnap. All rights reserved.Legal|Privacy policy|Modern Slavery Act Transparency Statement|Sitemap|About US| Contact US: help@patsnap.com