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Method for testing base band chip of satellite navigation receiver

A baseband chip and satellite navigation technology, applied in satellite radio beacon positioning system, measurement device, radio wave measurement system, etc., can solve the problems of high cost, insufficient test time resolution and result resolution, fault recurrence and Regression testing is difficult and other issues, to achieve the effect of cost reduction, verification speed and cost reduction

Active Publication Date: 2010-08-25
TECHTOTOP MICROELECTRONICS
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  • Abstract
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Problems solved by technology

[0008] The invention provides a new test method for baseband chips used in satellite navigation receivers, thereby solving the problems of high cost, difficulty in fault recurrence and regression testing, and insufficient time resolution and result resolution of the existing methods

Method used

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  • Method for testing base band chip of satellite navigation receiver
  • Method for testing base band chip of satellite navigation receiver
  • Method for testing base band chip of satellite navigation receiver

Examples

Experimental program
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specific Embodiment

[0039] This specific embodiment comprises the steps in turn:

[0040] 1) According to the user's input or preset, decide whether to use existing data for testing or collect new RF signals for testing, if using existing data for testing, go to step 5), if collecting new data To test, then go to 2) step;

[0041] 2) Convert the received navigation satellite radio frequency signal into a digital intermediate frequency signal through down-conversion, AGC, and ADC;

[0042] 3) Under the control of the digital intermediate frequency signal acquisition and storage control program, the digital intermediate frequency signal is collected and converted into a binary file and stored on the PC hard disk;

[0043] 4) The digital intermediate frequency signal acquisition control program decides to terminate the data acquisition process or perform the next data acquisition according to the user's input or preset, if it decides to perform the next data acquisition, then jump to step 2), if it d...

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Abstract

The invention relates to a method for testing a base band chip of a satellite navigation receiver. The method comprises the following steps in turn: receiving a navigation satellite radio-frequency signal and converting the radio-frequency signal into a digital intermediate-frequency signal; acquiring the obtained digital intermediate-frequency signal and converting the digital intermediate-frequency signal into a binary file; storing the obtained binary file; playing back the stored binary file to form the digital intermediate-frequency signal and transmitting the digital intermediate-frequency signal to the tested base band chip; and performing result accuracy judgment on the output of the tested base band chip. The method reduces the expense required for constructing a plurality of test platforms, and facilitates the judgment of the accuracy of the output of the to-be-tested base band chip on finer resolution.

Description

technical field [0001] The invention belongs to the field of integrated circuit testing devices, in particular to a testing method for a baseband chip of a satellite navigation receiver. Background technique [0002] At present, the following methods are mainly used for the verification and testing of the baseband chip of the satellite navigation receiver: [0003] 1. Register Transfer Level verification: The test stimulus (digital intermediate frequency signal) generated by the algorithm link is sent to the baseband chip to be tested, the output of the baseband chip is observed, and the correctness of the output result is analyzed. The advantages of this method are: 1) It can determine whether the baseband chip outputs the result at the correct time point at the cycle level; 2) It can determine the correctness of the baseband chip output result at the bit level; 3) It is convenient for the recurrence of the test failure . The disadvantages of this method are: 1) the test ...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01S19/40
Inventor 许祥滨吴钊锋陈浩
Owner TECHTOTOP MICROELECTRONICS
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