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Method for improving performance of light splitter, light splitter and X-ray measuring and analyzing device

A beam splitter and X-ray technology, applied in the field of optical measurement, can solve problems such as inaccurate measurement results, and achieve the effect of improving detection accuracy and performance

Inactive Publication Date: 2010-08-18
BEIJING GENERAL RES INST OF MINING & METALLURGY
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

Therefore, the measurement results of wavelength dispersion type X-ray measurement and analysis equipment are inaccurate

Method used

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  • Method for improving performance of light splitter, light splitter and X-ray measuring and analyzing device
  • Method for improving performance of light splitter, light splitter and X-ray measuring and analyzing device

Examples

Experimental program
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Effect test

Embodiment 1

[0023] This embodiment one provides a method for improving the performance of the spectrometer, the applicable spectrometer is a spectrometer used in X-ray measurement and analysis equipment, such as an ore pulp grade analyzer, etc., the spectrometer includes: a housing 1, an incident slit Component 2, light splitting crystal 4 and exit slit assembly 3; wherein, the entrance slit assembly 2 and exit slit assembly 3 are all arranged on the casing 1, and the light splitting crystal 4 is arranged in the casing 1 as the entrance slit A reflector between the slit assembly 2 and the exit slit assembly 3; the method includes:

[0024] Ray stoppers 5, 6, 7, 8, 9 are arranged in the beam splitter housing 1, so that the ray stoppers are arranged on each optical path around the splitting crystal in the housing, and pass through the ray stoppers 5, 6, 7, 8 , 9 Absorb or block part of the X-rays that enter from the incident slit assembly and can irradiate the inner wall of the housing 1, a...

Embodiment 2

[0028] The second embodiment provides a light splitter, and the structure of the light splitter is also as follows figure 1 As shown, it includes: housing 1, entrance slit assembly 2, beam splitter crystal 4, exit slit assembly 3 and ray blocks 5, 6, 7, 8, 9; wherein, the entrance slit assembly 2 and exit slit The slit assemblies 3 are all arranged on the casing 1, and the spectroscopic crystal 4 is arranged in the casing 1 as a reflector between the incident slit assembly 2 and the exit slit assembly 3; ray stoppers 5, 6, 7, 8 , 9 are arranged on each optical path around the spectroscopic crystal 4 in the casing, so that the ray blocks 5, 6, 7, 8, and 9 block or absorb part of the X-rays that enter from the incident slit assembly and can be irradiated on the inner wall of the casing , and absorb or block part of the X-rays that can be irradiated on the inner wall of the housing after being reflected by the spectroscopic crystal.

[0029] In the above beam splitter, multiple ...

Embodiment 3

[0033] This implementation three provides an X-ray measurement and analysis equipment, which can be used as an ore pulp grade analyzer. The equipment is composed of an X-ray tube, a high-voltage power supply, a detector, and a spectrometer. Spectrometer given. Since the X-ray measurement and analysis equipment is provided with a ray stopper in the beam splitter, the performance of the beam splitter is effectively improved, thereby improving the measurement accuracy of the X-ray measurement and analysis equipment.

[0034] To sum up, in the embodiment of the present invention, by setting and installing ray stoppers of different shapes and sizes in the beam splitter housing, part of the X-rays are prevented from being irradiated on the housing wall, and then emitted from the exit slit assembly, so that the detector receives To, and affect the detection accuracy of X-ray measurement and analysis equipment. The invention can correct the propagation path of rays in the beam splitt...

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Abstract

The invention provides a method for improving performance of a light splitter, a light splitter and an X-ray measuring and analyzing device, and belongs to the technical field of optical measurement. The light splitter suitable for the method comprises a shell, an entrance slit component, a light splitting crystal and an exit slit component, wherein the entrance slit component and the exit slit component are both arranged on the shell; and the light splitting crystal is arranged in the shell to serve as a reflector between the entrance slit component and the exit slit component. The method comprises the following steps: arranging a ray stop block in the shell of the light splitter and around the light splitting crystal in the shell; absorbing or blocking part of X ray which enters from the entrance slit component and irradiates on the inner wall of the shell by using the ray stop block; and absorbing or blocking part of the X ray which is reflected by the light splitting crystal to be irradiated on the inner wall of the shell. By using the method, the propagation path of the ray in the light splitter can be corrected so as to prevent influence of diffusion reflection on the X ray and obviously improve the performance of the light splitter.

Description

technical field [0001] The invention relates to the technical field of optical measurement, in particular to a method for improving the performance of a beam splitter, a beam splitter, and X-ray measurement and analysis equipment. Background technique [0002] The wavelength dispersion X-ray measurement and analysis equipment uses a spectrometer to split the characteristic X-rays, and then uses a detector to collect and subsequently process the characteristic X-rays split by the spectrometer. [0003] Currently known beam splitters use plane or curved beam splitting crystals, which are installed in the beam splitter housing. The entire beam splitter is generally composed of an incident slit assembly, a beam splitter shell, a beam splitting crystal, and an exit slit assembly. Since the X-rays enter the shell of the spectroscope through the entrance slit assembly, not all of them are irradiated on the spectroscopic crystal, some of the X-rays may be irradiated on the shell wa...

Claims

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Application Information

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IPC IPC(8): G01N23/20
Inventor 周俊武徐宁赵建军李杰徐晓东缪天宇卞宁
Owner BEIJING GENERAL RES INST OF MINING & METALLURGY
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