Non-contact type superconduction belt material critical current measuring device

Abstract

The invention belongs to the field of superconduction electrotechnics and particularly relates to a non-contact type superconduction belt material critical current measuring device. An excitation magnetic circuit and a probing magnetic circuit are fixed on a base in parallel, a magnetization slit central point of the excitation magnetic circuit has equal altitude with a sample slit central point of the probing magnetic circuit, an excitation magnetic circuit iron core and a magnetization slit form a closed excitation magnetic circuit, and a probing magnetic circuit iron core, a sample slit and a measurement slit form a closed probing magnetic circuit. On the basis of a cirtical current non-contact type measuring method of a magnetic circuit method, under a condition of liquid nitrogen and low temperature, a sample is magnetized at a magnetization slit of the excitation magnetic circuit for inducing a ring current, then the sample is placed in the sample slit of the probing magnetic circuit, magnetic induction generated by the probing magnetic circuit driven by the ring current is probed at the measurement slit of the probing magnetic circuit, and the probed magnetic induction and a standard sample are compared and back-calculated to obtain a sample critical current. The invention overcomes the defect that the accurate positioning of the sample and a probe is required in the prior art, has high measuring efficiency and is particularly suitable for continuously measuring an overlength superconduction belt material critical current.

Description

technical field [0001] The invention belongs to the field of superconducting electrical engineering, in particular to a non-contact critical current measuring device for superconducting strips. Background technique [0002] Critical current is the most basic parameter reflecting the current carrying capacity of superconducting strips. The commonly used measurement method is the "four-lead method", that is, to load a current at both ends of the sample and observe the voltage signal. As the current increases, the critical current of the superconducting strip is determined by observing the increase of the voltage and taking 1 microvolt per centimeter of strip length as the quench criterion. This method has a simple principle and is widely used in the measurement of short samples with a length of less than 10 cm at the laboratory level. At present, the industrial production of Bi-based high-temperature superconducting wires has been realized. The length of a single Bi-based hi...

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Problems solved by technology

[0005] The purpose of the present invention is to solve the method in the prior art of measuring the magnetic induction intensity of the residual magnetic field of the superconducting strip in space and then back-calculating the critical current, that is, the Hall probe of "replacing the surface with points" is measured on the surface of the superconducting strip. The magnetic induction intensity of the residual magnetic field requires high positioning accuracy between the probe and the sample, large measurement errors, and low efficiency.

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