Method for picking model type crystal particle

Abstract

The invention relates to a method for picking model type crystal particles, comprising the following steps of: firstly providing a wafer fully distributed with crystal particles; obtaining a wafer map fully distributed with the crystal particles through a CCD system (image identifying and positioning system); dividing the wafer map into a plurality of dividing areas; recording the relative positions among the crystal particles (including the model type crystal particles) to be used as the basis reference of the displacement compensation correction of the crystal particles in the picking process of the crystal particles; then selecting crystal particles as the model type crystal particles from the centers of the several dividing areas of the plurality of dividing areas; then selecting bin crystal particles with the minimum crystal particle sum quantity to start to pick by using initial model type crystal particles in the dividing areas as starting points; then sequentially picking the bin crystal particles in all the dividing areas one by one in a model way; and repeating in such a way so as to completely pick all the crystal particles. The action of deflection compensation correction is needed because crystal particle deflection situations can be generated in the picking process of the crystal particles. By adopting the method, the crystal particles can be faster and more accurate picked.

Description

technical field [0001] The present invention relates to a method for picking grains of the pacesetter type, in particular, it refers to a method of using pacesetters to increase the displacement in order to make the process of grain classification and picking more accurate and efficient, so it is necessary to make displacement deviation compensation more effective. The ability to compensate for deviations, while picking at the same level is to make the practice of continuously changing levels during the entire picking process in the past, that is, to make displacement deviation compensation more effective through the selection of pacesetters, while picking at the same level is due to A brand-new die picking method that reduces the number of upgrades (Bin changes) and enables faster die picking. Background technique [0002] see figure 1 (Please also refer to figure 2 ), this figure is a flow chart of one of the known grain picking methods of the present invention, and the...

AI Technical Summary

Problems solved by technology

[0008] By the way, there are many kinds of known die sorting methods, the above is one of the method flow, but all of them are too slow, the efficiency is too low, or the die sorting process is not accurate enough, which leads to the misselection of die Therefore, the inventor proposes a brand-new grain sorting method, that is, in the conventional grain sorting process, the pacesetter is added to the concept of position deviation compensation and the concept of grain same-level (Bin) picking is used to improve the grain size. The accuracy and speed efficiency of grain picking, and at the same time, the high efficiency of the overall grain picking process is improved. It can be seen that the present invention is quite patentable and original, and there is no such leaping pacesetter as far as the eye can see. The grain sorting method is publicly used, and the invention of the present invention is an original invention

Images