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Probe card

A technology of probe cards and probes, which is applied in the field of probe cards, can solve problems such as unqualified rate, the tip of the probe cannot meet the accuracy of the object to be tested, etc., and achieve the effect of greatly increasing the accuracy and simplifying the combined procedure

Inactive Publication Date: 2010-06-09
PLEADER YAMAICHI
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

However, since the distance between these probe tips must be controlled manually one by one when each probe is adhered to the probe holder with epoxy resin (Epoxy); because, the traditional probe has a The pointed part and a one-legged fixed part, wherein the pointed part is used to make electrical contact with the object to be tested, and the fixed part is used to connect to the fixed seat, but during the assembly process, the fixed part is a single The pin-type insertion method, so although the positioning of the fixed part in the X and Y-axis directions is maintained after bonding, the tip will deflect in the Z-axis direction. This kind of assembly structure is not only too complicated but also prone to probe tip The position of the part is not correct, so that the needle tip of these probes cannot meet the accuracy of correct contact with the object to be tested, resulting in a high failure rate

Method used

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Experimental program
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Embodiment Construction

[0022] In order to enable a further understanding and recognition of the features and characteristics of the present invention, the following preferred embodiments are listed below and described in conjunction with the accompanying drawings:

[0023] see figure 1 and figure 2 , is a probe card 100 provided by a preferred embodiment of the present invention, which mainly includes a circuit board 10, a probe holder 20, and a plurality of probes 30; wherein:

[0024] The circuit board 10 has a first end face 11 and a second end face 12, and a plurality of circuit wirings (not shown) are arranged between the first and second end faces 11, 12, and on the first end face 11 and There are a plurality of welding pad groups 13 connected to the circuit wiring; wherein each welding pad group 13 includes two welding pads 131 separated by a predetermined distance.

[0025] The probe fixing base 20 includes a positioning plate 21 and a plurality of coupling components 22; Hole groups 213...

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PUM

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Abstract

The invention relates to a probe card comprising a circuit board, a probe fixing seat and a plurality of probes, wherein the circuit board is provided with a plurality of welding pads; the probe fixing seat is provided with a positioning plate and a plurality of combining pieces; the positioning plate is provided with a plurality of positioning holes; the combining pieces are arranged in the positioning holes and electrically connected with the welding pads of the circuit board; each probe is provided with a body part, a tip part connected with one end of the body part, and at least two fixing parts connected with the other end of the body part; the two fixing parts have a preset distance and are respectively and electrically connected with the combining pieces; and the two fixing parts with the preset distance are connected with the combining pieces in the positioning holes of the positioning plate for realizing a positioning effect and simplifying an assembly procedure.

Description

technical field [0001] The invention relates to a probe card, more specifically, a probe card with precise positioning and convenient assembly. Background technique [0002] The probe card mainly uses a plurality of probes to make electrical contact with the object to be tested, so as to make temporary electrical contact on a test chip, a display panel or others. [0003] The probes must be fixed on a probe fixing base connected to a circuit board, and the needle tips of the probes must be kept at a predetermined distance to correspond to the test pad spacing on the chip to be tested. However, since the distance between these probe tips must be controlled manually one by one when each probe is adhered to the probe holder with epoxy resin (Epoxy); because, the traditional probe has a The pointed part and a one-legged fixed part, wherein the pointed part is used to make electrical contact with the object to be tested, and the fixed part is used to connect to the fixed seat, b...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01R1/067G01R1/073
Inventor 卢笙丰
Owner PLEADER YAMAICHI
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